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Search Publications by: Gordon A. Shaw (Fed)

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Displaying 51 - 75 of 103

Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses

September 8, 2009
Author(s)
Gordon A. Shaw, Joseph J. Maurer, Steven E. Fick, Thomas P. Moffat, J. J. Mallett, John L. Hudson
Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Because of

Accurate Picoscale Forces for Insitu Calibration of AFM

September 3, 2009
Author(s)
Koo-Hyun Chung, Gordon A. Shaw, Jon R. Pratt
The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force microscope

Methods for transferring the SI unit of force from millinewtons to piconewtons

June 1, 2009
Author(s)
Gordon A. Shaw, Koo-Hyun Chung, Douglas T. Smith, Jon R. Pratt
The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units (SI). To this end, a host of different means are being employed by the NIST small force

Contactless Differential Conductivity Detection

October 12, 2008
Author(s)
Gordon A. Shaw, David J. Ross, Steven E. Fick, Wyatt N. Vreeland
We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configuration

A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy

June 2, 2008
Author(s)
Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt
A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films and

Reducing Thermal Noise in Molecular Force Spectroscopy

June 2, 2008
Author(s)
Gordon A. Shaw
Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules. The precision determination of these properties requires an instrument capable of piconewton-level force measurement. The atomic force microscope (AFM)

Spring constant calibration of AFM cantilevers with a piezosensor transfer standard

September 24, 2007
Author(s)
Eric Langlois, Gordon A. Shaw, John A. Kramar, Jon R. Pratt, Donna C. Hurley
We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and accompanying electronics. The piezosensor was calibrated before use

Direct Electrostatic Calibration of Hybrid Sensors for Small Force Measurement

June 4, 2007
Author(s)
Koo-Hyun Chung, Gordon A. Shaw, Jon R. Pratt
The measurement of forces from piconewtons to millinewtons is an area of interest from both an applied and pure research standpoint, however creating a link between small forces and the International System of Units (SI) has been difficult. In this work, a