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Search Publications by: Lei Chen (Fed)

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Displaying 26 - 38 of 38

Nanofabrication Techniques for Controlled Drug Released Devices

January 1, 2011
Author(s)
Lei Chen, Gerard Henein, Vincent K. Luciani
New drugs and delivery systems have undergone a rapid development in recent years for treating cancer, HIV aids, diseased organs, damaged nerves to relieve pain, prevent disease and restore health to human beings. The application of nanofabrication in

Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals

October 7, 2010
Author(s)
Hua Xu, Lei Chen, Liangbing Hu, Nikolai B. Zhitenev
We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structures

Nanoparticle size and shape evaluation using the TSOM optical microscopy method

June 6, 2010
Author(s)
Ravikiran Attota, Richard J. Kasica, Lei Chen, Premsagar P. Kavuri, Richard M. Silver, Andras Vladar
We present a novel optical TSOM (through-focus scanning optical microscopy - pronounced as 'tee-som') method that produces nanoscale dimensional measurement sensitivity using a conventional optical microscope. The TSOM method uses optical information from

Super-hydrophobic and/or Super-hydrophilic Surfaces Made by Plasma Process

May 8, 2009
Author(s)
Lei Chen, Gerard Henein, James A. Liddle
In this paper, a simple, fast, all-plasma surface modification (APSM) process, which can form super-hydrophobic and/or super-hydrophilic surfaces is introduced. The APSM process includes plasma-induced surface nano-pattern formation, substrate etching and

Reference Metrology in a Research Fab: The NIST Clean Calibrations Thrust

April 12, 2009
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Thomas B. Renegar, Xiaoyu A. Zheng, Theodore V. Vorburger, Albert M. Hilton, Marc J. Cangemi, Lei Chen, Michael A. Hernandez, Russell E. Hajdaj, Michael R. Bishop, Aaron Cordes
In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) – a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab – a 1765 m2 (19,000 ft2) clean

Through-focus Scanning and Scatterfield Optical Methods for Advanced Overlay Target Analysis

September 1, 2008
Author(s)
Ravikiran Attota, Michael T. Stocker, Richard M. Silver, Nathanael A. Heckert, Hui Zhou, Richard J. Kasica, Lei Chen, Ronald G. Dixson, Ndubuisi G. Orji, Bryan M. Barnes, Peter Lipscomb
In this paper we present overlay measurement techniques that use small overlay targets for advanced semiconductor applications. We employ two different optical methods to measure overlay using modified conventional optical microscope platforms. They are

Where EAP Security Claims Fail

August 14, 2007
Author(s)
Katrin Hoeper, Lei Chen
The Extensible Authentication Protocol (EAP) is widely used as an authentication framework to control the access to wireless networks, e.g. in IEEE 802.11 and IEEE 802.16 networks. In this paper, we discuss limitations of EAP security and demonstrate how

Nanoscale Chemical Imaging of Polymeric Materials With Atomic Force Microscopy

February 26, 2003
Author(s)
Xiaohong Gu, Tinh Nguyen, Michael J. Fasolka, D Julthongpiput, Lei Chen, Mark R. VanLandingham, Y C. Jean, Jonathan W. Martin
Nanoscale spatial chemical information is essential to developing a molecular-level understanding of a variety of phenomena occurring at surfaces and interfaces, including adhesion, friction, and surface reactivity. Therefore, the ability to probe and