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Search Publications by: James A. Beall (Fed)

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Displaying 126 - 150 of 216

Role of Oxygen Pressure during Deposition on the Microwave Properties of YBCO Films

June 1, 1999
Author(s)
David A. Rudman, F. J. Stork, James Booth, J. Y. Juang, Leila R. Vale, G. J. Beatty, C. I. Williams, James A. Beall, Ronald H. Ono, S. B. Qadri, M. S. Osofsky, E. F. Skelton, John H. Claassen, G. Gibson, J. L. MacManus-Driscoll, N. Malde, L. F. Cohen
We have studied the effect of oxygen pressure (PO 2) during pulsed laser deposition on the properties of YBCO films, with particular attention to the low power microwave surface resistance R s.

Simultaneous Optimization of Linear and Nonlinear Microwave Response of YBCO Films

June 1, 1999
Author(s)
James Booth, James A. Beall, David A. Rudman, Leila R. Vale, Ronald H. Ono, Christopher L. Holloway, S. B. Qadri, M. S. Osofsky, E. F. Skelton, J. H. Claasen, G. Gibson, J. L. MacManus-Driscoll, N. Malde, L. F. Cohen
We present results of a systematic study of the effect of film deposition temperture on both the linear and nonlinear response of super-conducting Yba 2Cu 3O7-γ^ (YBCO) thin films and devices at microwave frequencies. Measurements of the unpatterned films

RF Power Dependence Study of Large Area YBCO Thin Films

June 1, 1997
Author(s)
Z Ma, E. I. DeObaldia, G. Hampel, P. A. Polakos, P. M. Mankiewich, B. Batlogg, W. Prusseit, H. Kinder, Angela Anderson, D. E. Oates, Ronald H. Ono, James A. Beall
In an effort to develop HTS superconducting filters with sufficient power handling capability for PCS (Personal Communication Services) base station transmit applications, we have undertaken a study of the power dependence of large area YBCO thin films on

Surface resistance and morphology of YBCO films as a function of thickness

June 1, 1997
Author(s)
F. J. Stork, James A. Beall, Alexana Roshko, Donald C. DeGroot, David A. Rudman, Ronald H. Ono, Jerzy Krupka
We have examined the thickness dependence of the growth morphology and surface resistance Rs of laser ablated YBa 2Cu 3O 7-x films with transition temperatures over 89 K and critical current densities greater than 10 6 A/cm2 at 76 K. The thickness was

A Model of Voltage-Dependent Dieletric Losses for Ferroelectric MMIC Devices

December 31, 1995
Author(s)
J. F. Scott, J. Price, James A. Beall, Ronald H. Ono, C. A. Paz de Araujo, L. D. McMillian
The use of high-dielectric films for microwave devices, especially phased-array radar systems, in the tens of GHz regime requires very low-loss (0.01 to 0.1) films. Unfortunately most ferroelectrics have losses that diverge (greater than unity) in this