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Search Publications by: Dylan Williams (Fed)

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Displaying 101 - 125 of 294

Calibrations for Millimeter-Wave Silicon Transistor Characterization

March 1, 2014
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for

A Prescription for Sub-Millimeter-Wave Transistor Characterization

July 1, 2013
Author(s)
Dylan F. Williams, Adam C. Young, Urteaga Miguel
We present an approach for characterizing transistors embedded in microstrip lines formed on a thin bisbenzocyclobutene-based (BCB) monomers film at sub-millimeter-wave frequencies. We demonstrate the approach to 750 GHz and estimate the uncertainty of the

Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits

July 1, 2013
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Tai Wei, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
We study and present design guidelines for thru-reflect-line vector-network-analyzer calibration kits used for characterizing circuits and transistors fabricated on silicon integrated circuits at millimeter-wave frequencies. We compare contact-pad designs

The Impact of Characteristic Impedance on Waveform Calibrations

June 7, 2013
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale
We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of

The Impact of Characteristic Impedance on Waveform Calibrations

June 7, 2013
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale
We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of

A Precision Millimeter-Wave Modulated-Signal Source

June 6, 2013
Author(s)
Catherine A. Remley, Paul D. Hale, Dylan F. Williams, Chih-Ming Wang
We develop and characterize a modulated-signal source for use at millimeter-wave frequencies. Components within the source are phase locked by a 10 GHz reference source to minimize drift and improve synchronization. The complex frequency response of the

Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform

October 1, 2012
Author(s)
Chih-Ming Wang, Paul D. Hale, Jeffrey A. Jargon, Dylan F. Williams, Catherine A. Remley
We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the information in

Legendre Fit to the Reflection Coefficient of a Radiating Rectangular Waveguide Aperture

August 1, 2012
Author(s)
Dylan F. Williams, Mohammad T. Ghasr, Bradley K. Alpert, Zhongxiang Shen, Alexander Arsenovic, Robert M. Weikle, Reza Zoughi
We accurately calculate the reflection coefficient and normalized admittance of radiating open-ended rectangular waveguides and fit our results with a linear combination of Legendre polynomials. We verify the expression to an accuracy of 0.005 with other

Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

July 6, 2012
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Chih-Ming Wang, Jeffrey A. Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic

A statistical study of de-embedding applied to eye diagram analysis

February 1, 2012
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M. Dienstfrey, Dylan F. Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any

500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

October 31, 2011
Author(s)
Dylan F. Williams
We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art rectangular-waveguide vector-network-analyzer measurements over the frequency range 500 GHz – 750 GHz. We use the analysis to assess thru-reflect

On-Chip Security Using Electromagnetic Analysis

October 27, 2011
Author(s)
James Schaffner, Dylan Williams
In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic

Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations

October 10, 2011
Author(s)
Dylan F. Williams, Franz-Joseph Schmuckle, Ralf Dorner, G.N. Phung, Wolfgang Heinrich, Uwe Arz
We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and their

Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements

September 28, 2010
Author(s)
Arkadiusz C. Lewandowski, Dylan F. Williams, Wojciech Wiatr
We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm to

Editorial: Message From the Outgoing Editors

September 10, 2010
Author(s)
Dylan F. Williams
Some four years ago, we took the responsibility for editing this TRANSACTIONS. Our editorial duties have now ended. It has been a privilege and honor to serve our readers and our authors.

Editorial: Editorial re. Associate Editors

August 1, 2010
Author(s)
Dylan F. Williams
Our editing team is key to the success of the Transactions. The Associate Editors who commit to a term of service are dedicated individual who work on a strictly voluntary basis to ensure the high quality of the manuscripts that are published. this is not