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Search Publications by: Dylan Williams (Fed)

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Displaying 151 - 175 of 583

Model Verification with Measurement Uncertainty

November 1, 2016
Author(s)
Dylan F. Williams, Richard A. Chamberlin, Jerome G. Cheron, Wei Zhao, Urteaga Miguel
We verify a model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the model-extraction and verification process, and use them to

The Role of Measurement Uncertainty in Achieving First-Pass Design Success

October 22, 2016
Author(s)
Dylan Williams, Richard Chamberlin, Wei Zhao, Jerome Cheron, Urteaga Miguel
We investigate the role of measurement uncertainty in achieving first-pass design success at microwave frequencies. We develop a model for state-of-the-art 250 nm heterojunction bipolar transistors, and demonstrate the propagation of correlated measurement

Publications Committee

August 8, 2016
Author(s)
Dylan F. Williams
A description of the IEEE Microwave Theory and Techniques Society Budget Committee.

Verification of a Foundry-Developed Transistor Model with Measurement Uncertainty

May 26, 2016
Author(s)
Dylan Williams, Richard Chamberlin, Wei Zhao, Jerome Cheron, Urteaga Miguel
We verify a foundry model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the verification process, and use them to quantify the

Estimating and Reducing Uncertainty in Reverberation-Chamber Characterization at Millimeter-Wave Frequencies

April 20, 2016
Author(s)
Damir Senic, Catherine A. Remley, Chih-Ming Wang, Dylan F. Williams, Christopher L. Holloway, Diogo Ribeiro, Ansgar T. Kirk
This contribution provides techniques for accurately characterizing the measurement uncertainty due to chamber setup for total radiated power measurements at millimeter-wave frequencies. The setup is based on the reverberation chamber as a well-known

Large-Signal-Network-Analyzer Round Robin

February 1, 2016
Author(s)
Dylan F. Williams, Paul D. Hale, Catherine A. Remley, Gustavo Avolio, Dominique Schreurs, Diogo C. Ribeiro, Pawel Barmuta, Gian Piero Gibiino, Mohammad Rajabi, Arkadiusz Lewandowski, Jaros?aw Szatkowski, Kuangda Wang
This paper describes tests of the calibration-comparison method as an approach to assessing the measurement accuracy of large-signal network analyzer calibrations. We show that having one trusted reference calibration allows the calibration accuracy of the

Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors

June 1, 2015
Author(s)
Gustavo Avolio, Antonio Raffo, Jeffrey Jargon, Dominique Schreurs, Dylan Williams
This work focuses on the accuracy of nonlinear de-embedding applied to microwave transistor time-domain waveforms. The waveforms are acquired with a mixer-based Large-Signal Network Analyzer (LSNA) and are corrected at the transistor's reference planes by