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Displaying 201 - 225 of 299

Calibrating Electro-Optic Sampling Systems

May 1, 2001
Author(s)
Dylan Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We apply frequency-domain impedance mismatch corrections to a temporal electro-optic sampling system. We identify and evaluate additional sources of measurement uncertainty. We use the system to characterize the magnitude and phase response of a

Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration

May 1, 2001
Author(s)
Kate Remley, Dylan Williams, Donald C. DeGroot, Jan Verspecht, John Kerley
We examine the effects of nonlinear diode junction capacitance on the fundamental premise of the noise-to-nose calibration, that the kickout is identical in shape to the impulse response of the sampler. We offer a physical explanation for the error

Four-Port Microwave Measurement System Speeds On-Wafer Calibration and Test

March 1, 2001
Author(s)
Dave K. Walker, Dylan F. Williams, Allen Padilla, Uwe Arz, Hartmut Grabinski
A multiport measurement system comprising a coaxial switch network and comprehensive freeware package extends the capabilities of a user's two-port automatic network analyzer and probe station to three-and four-port measurements. The coaxial switch matrix

Frequency Response Metrology for High-Speed Optical Receivers

March 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams
There are two types of optical sources whose modulation can be measured or calculated from fundamental principles: the hererodyne beat between two single- frequency lasers (frequency-domain) and the short pulse from a mode-locked laser (time-domain). While

Asymmetric coupled CMOS lines-an experimental study

December 1, 2000
Author(s)
Uwe Arz, Dylan F. Williams, Dave K. Walker, Hartmut Grabinski
Abstract: This paper investigates the properties of asymmetric coupled lines built in a 0.25- m CMOS technology over the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from calibrated four-port

Lumped-Element Models for On-Wafer Calibration

December 1, 2000
Author(s)
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards

Mismatch Corrections for Electro-Optic Sampling Systems

December 1, 2000
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the

Accurate Electrical Measurement of Coupled Lines on Lossy Silicon

October 1, 2000
Author(s)
Uwe Arz, Dylan F. Williams, Dave K. Walker, Hartmut Grabinski
In this paper we apply a measurement method designed for asymmetric coupled lines to determine the broadband propagation characteristics of symmetric coupled lines fabricated on a highly conductive silicon substrate. We show that the matrices of frequency

Contact-Pad Design for High-Frequency Silicon Measurements

October 1, 2000
Author(s)
Dylan Williams, A. C. Byers, V. C. Tyree, Dave K. Walker, J. J. Ou, X. Jin, M. Piket-Moy, C. Hu
We measure and compare the electrical parasitics of contact pads of different designs fabricated on silicon integrated circuits and develop a strategy for reducing the parasitics.

On-Wafer Measurement of Transmission Lines On Lossy Silicon Substrates

September 25, 2000
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
This paper examines broadband measurement techniques for electrical properties of planar transmission lines built on lossy silicon substrates. We start by investigating the performance of a new formulation of the calibration com-parison method which is

Computation of Causal Characteristic Impedances

June 12, 2000
Author(s)
Dylan F. Williams, Ronald C. Wittmann
We develop a numerical method of determining the magnitude of characteristic impedance required by causal power-normalized circuit theories from its phase using a Hilbert-transform relationship. We also estimate the uncertainty in the method.

Characterization of Asymmetric Coupled CMOS Lines

June 1, 2000
Author(s)
Uwe Arz, Dylan F. Williams, Dave K. Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter

Coplanar-Waveguide-to-Microstrip Transition Model

June 1, 2000
Author(s)
Wojciech Wiatr, Dave K. Walker, Dylan Williams
We develop a novel four-port equivalent circuit for a coplanar-waveguide-to-microstrip transition using a finite-difference time-domain analysis. The lumped model accounts for mutual inductive coupling and works well up to about 30 GHz.

Realistic Sampling-Circuit Model for a Nose-to-Nose Simulation

June 1, 2000
Author(s)
Catherine A. Remley, Dylan F. Williams, Donald C. DeGroot
We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.

Causality and Characteristic Impedance

December 2, 1999
Author(s)
Dylan F. Williams, Bradley K. Alpert
A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.

Nose-to-Nose Response of a 20-GHz Sampling Circuit

December 1, 1999
Author(s)
Dylan F. Williams, Catherine A. Remley, Donald C. DeGroot
We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impedance

Characteristic Impedance of Microstrip on Silicon

October 25, 1999
Author(s)
Dylan F. Williams, Bradley K. Alpert
We compare power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip transmission lines on silicon substrates.

Characteristic impedance of microstrip on silicon

October 25, 1999
Author(s)
Dylan F. Williams, Bradley K. Alpert
In this paper, we compare the power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip transmission lines on silicon substrates.

A Causal Microwave Circuit Theory and Its Implications

August 1, 1999
Author(s)
Dylan Williams, Bradley Alpert
We will describe a new causal power-normalized waveguide equivalent-circuit theory and explore its implications. The new theory marries a power normalization with additional constraints that enforce simultancity of the theory's voltages and currents and

Electrical Measurements for Electronic Interconnections at NIST

August 1, 1999
Author(s)
Dylan Williams, Donald C. DeGroot
The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the
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