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Search Publications by: Kevin J. Coakley (Fed)

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Displaying 151 - 175 of 183

Calibration of a Stopping Power Model for Silicon Based on Analysis of Neutron Depth Profiling and Secondary Ion Mass Spectrometry Measurements

June 1, 2002
Author(s)
Kevin J. Coakley, Huaiyu H. Chen-Mayer, George P. Lamaze, David S. Simons, P E. Thompson
We measure the boron concentration versus depth profile within a silicon sample with four delta-doped planes by secondary ion mass spectrometry. In a neutron depth profiling (NDP) experiment, we illuminate the sample with a neutron beam. Nuclear reactions

Uncertainty of Oscilloscope Timebase Distortion Estimate

February 1, 2002
Author(s)
Chih-Ming Wang, Paul D. Hale, Kevin Coakley, Tracy S. Clement
We study several problems related to the characterization of the timebase in high-speed sampling oscilloscopes. First, we examine the bias of using the method of the first-order approximation to estimate the additive and time jitter noises, and present a

A Weekly Cycle in Atmospheric Carbon Dioxide

January 1, 2002
Author(s)
R S. Cerveny, Kevin Coakley
We present a new statistic called the Mean Symmetrized Residual (MSR) for detection and quantification of a weekly cycle in measured daily atmospheric carbon dioxide (CO 2). At the Mauna Loa Observatory in Hawaii, we conclude that CO 2 concentrations, on

Alignment of Noisy Signals

February 1, 2001
Author(s)
Kevin J. Coakley, Paul D. Hale
We study the relative performance of various methods for aligning noisy one dimensional signals. In each method, we estimate the relative shifts of a set of signals which are translated with respect to each other. We simulate signals corrupted by both

Guest Editorial: Advances in Quantitative Image Analysis

January 1, 2001
Author(s)
Kevin J. Coakley, M Levenson
Kevin Coakley and Mark Levenson were invited to solicit papers on Quantitative Imaging for a special issue of the International Journal of Imaging Systems and TEchnology. They briefly describe the papers in a commentary that will appear in the special

Likelihood Models for Two-Stage Neutron Lifetime Experiments

January 1, 2001
Author(s)
Grace L. Yang, Kevin J. Coakley
At the NIST Cold Neutron Research Facility, a multiple run neutron lifetime experiment is underway. Each run of the two-stage experiment consists of a neutron production stage and a neutron decay stage. Salient features of the experimental data are that

Lumped-Element Models for On-Wafer Calibration

December 1, 2000
Author(s)
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards