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Search Publications by: Mark Keller (Fed)

Displaying 76 - 100 of 100

Dynamic Input Capacitance of Single-Electron Transistors and the Effect on Charge-Sensitive Electrometers

June 1, 2000

Author(s)

Neil M. Zimmerman, Mark W. Keller

Photon-Assisted Tunneling in Electron Pumps

May 29, 2000

Author(s)

M. Covington, Mark W. Keller, Richard L. Kautz, John M. Martinis

We measure photon-assisted tunneling in 4- and 6-junction electron pumps at photon frequencies up to 60 GHz. We determine the microwave voltage at the pumps using noise thermometry. The standard theory of leakage in the electron pump, modified to include

A Capacitance Standard Based on Counting Electrons: Progress Report

May 1, 2000

Author(s)

Mark W. Keller, Neil M. Zimmerman, Ali L. Eichenberger, John M. Martinis

We have built a prototype capacitance standard based on single-electron tunneling (SET) devices and a cryogenic vacuum-gap capacitor. We are currently involved in a thorough uncertainty analysis of the prototype, and we are preparing to make a direct

Measurement of the Frequency Dependence of a Single-Electron Tunneling Capacitance Standard

May 1, 2000

Author(s)

Ali L. Eichenberger, Mark W. Keller, John M. Martinis, Neil M. Zimmerman

In the context of a proposed new capacitance standard based on counting electrons, we discuss a method to investigate its frequency dependence. We describe measurements of this frequency dependence using a technique that involves the same single-electron

A Capacitance Standard Based on Counting Electrons

September 10, 1999

Author(s)

Mark W. Keller, Ali L. Eichenberger, John M. Martinis, Neil M. Zimmerman

A capacitance standard based directly on the definition of capacitance was built. Single-electron tunneling devices were used to place N electrons of charge e onto a cryogenic capacitor C, and the resulting voltage change ΔV was measured. Repeated

A Capacitance Standard Based on Counting Electrons

September 1, 1999

Author(s)

Mark W. Keller, A P. Chen, John M. Martinis, Neil M. Zimmerman

A capacitance standard based directly on the definition of capacitance was built.

Leakage and Counting Errors in a Seven-junction Electron Pump

September 1, 1999

Author(s)

Richard L. Kautz, Mark W. Keller, John M. Martinis

Leakage and counting errors are explored experimentally in a well-characterized seven-junction electron pump and compared with predictions of the orthodox theory, including cotunneling.