Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Kate Remley (Assoc)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 401 - 425 of 437

Extended NVNA Bandwidth for Long-Term Memory Measurements

June 11, 2004
Author(s)
Catherine A. Remley, Dominique Schreurs, Dylan F. Williams, John Wood
We present a new technique for measuring the magnitude and phase of intermodulation products outside the measurement bandwidth of our instrumentation. We apply the technique to measurements of long-term memory effects, and realte our measurements to

State-Space Modeling of Slow-Memory Effects Based on Multisine Vector Measurements

December 4, 2003
Author(s)
Dominique Schreurs, Kate Remley, M. Myslinski, R. Vandermissen
Non-linear microwave devices and circuits often exhibit slow-memory effects. When subjected to two-tone, or more general multisine excitations, the characteristics of these devices and circuits depend on the offset frequency between the tones. Since

RF and IF mixer optimum matching impedances extracted by large-signal vectorial measurements

October 7, 2003
Author(s)
Alessandro Cidronali, Giovanni Loglio, Jeffrey Jargon, Kate Remley, I. Magrini, Donald C. DeGroot, Dominique Schreurs, Kuldip Gupta, Gianfranco Manes
This paper introduces a new technique that allows us to measure the admittance conversion matrix of a two-port device, using a Nonlinear Vector Network Analyzer. This method is applied to extract the conversion matrix of a 0.2 micron pHEMT, driven by a 4.8

RF Behavioural Modelling from Multisine Measurements: Influence of Excitation Type

October 7, 2003
Author(s)
Dominique Schreurs, M. Myslinski, Catherine A. Remley
Behavioural models for RF devices are typically based on large-signal RF measurements. Until now, those measurements were usually limited to single-tone excitations. In this work, we focus on the use of multisines in the experiment design, and, more

Extraction of Conversion Matrices for P-HEMTs based on Vectorial Large-Signal Measurements

June 17, 2003
Author(s)
Alessandro Cidronali, Kuldip Gupta, Jeffrey Jargon, Kate Remley, Donald C. DeGroot, Gianfranco Manes
This paper introduces a new technique which allows us to measure the admittance conversion matrix of a two-port device, using a large signal vector network analyzer. This method is applied to extract the conversion matrix of a 0.25 um PHEMT, driven by a 4

Multisine Excitation for ACPR Measurements

June 17, 2003
Author(s)
Catherine A. Remley
We use a simlator to compare ACPR measurements of a nonlinear device excited with various multisine signals to ACPR measurements of the same device excited with a QPSK-modulated pseudorandom digital signal. We examine four common types of multisine

Sampling Oscilloscope Models and Calibrations

June 17, 2003
Author(s)
Kate Remley, Dylan Williams
We discuss the basic principles of operation of electrical sampling oscilloscopes and describe circuit models developed to design, characterize, and help explain their operation. We survey common oscilloscope calibration schemes that correct for finite

Phase Detrending for Measured Multisine Signals

June 13, 2003
Author(s)
Kate Remley, Dylan Williams, Dominique Schreurs, Giovanni Loglio, Cidronali Alessandro
We develop a method to detrend the phases of measured multisine signals. We find a time reference that removes the linear component of the measured phases and aligns them to their expected values to the precision specified by the user. An initial guess is

Repeat Measurements and Metrics for Nonlinear Model Development

June 6, 2002
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.