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Search Publications by: Kate Remley (Fed)

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Displaying 201 - 222 of 222

Simplifying and Interpreting Two-Tone Measurements

November 1, 2004
Author(s)
Kate Remley, Dylan Williams, Dominique Schreurs, John Wood
We develop a mathematical description of the response of systems to second-order memory mechanisms based on a time-varying gain modulation function. We show that intermodulation products arising from interactions at baseband have different phase symmetries

NVNA Users’ Forum: Mission and Overview

October 12, 2004
Author(s)
Catherine A. Remley, Dominique Schreurs, Wendy Van Moer
This paper introduces the NVNA Users' Forum, an informal discussion group devoted to sharing information and issues related to instrumentation utilized in vector large-signal network analysis of microwave circuits and systems that contain nonlinear

Extended NVNA Bandwidth for Long-Term Memory Measurements

June 11, 2004
Author(s)
Catherine A. Remley, Dominique Schreurs, Dylan F. Williams, John Wood
We present a new technique for measuring the magnitude and phase of intermodulation products outside the measurement bandwidth of our instrumentation. We apply the technique to measurements of long-term memory effects, and realte our measurements to

State-Space Modeling of Slow-Memory Effects Based on Multisine Vector Measurements

December 4, 2003
Author(s)
Dominique Schreurs, Kate Remley, M. Myslinski, R. Vandermissen
Non-linear microwave devices and circuits often exhibit slow-memory effects. When subjected to two-tone, or more general multisine excitations, the characteristics of these devices and circuits depend on the offset frequency between the tones. Since

RF and IF mixer optimum matching impedances extracted by large-signal vectorial measurements

October 7, 2003
Author(s)
Alessandro Cidronali, Giovanni Loglio, Jeffrey Jargon, Kate Remley, I. Magrini, Donald C. DeGroot, Dominique Schreurs, Kuldip Gupta, Gianfranco Manes
This paper introduces a new technique that allows us to measure the admittance conversion matrix of a two-port device, using a Nonlinear Vector Network Analyzer. This method is applied to extract the conversion matrix of a 0.2 micron pHEMT, driven by a 4.8

RF Behavioural Modelling from Multisine Measurements: Influence of Excitation Type

October 7, 2003
Author(s)
Dominique Schreurs, M. Myslinski, Catherine A. Remley
Behavioural models for RF devices are typically based on large-signal RF measurements. Until now, those measurements were usually limited to single-tone excitations. In this work, we focus on the use of multisines in the experiment design, and, more

Extraction of Conversion Matrices for P-HEMTs based on Vectorial Large-Signal Measurements

June 17, 2003
Author(s)
Alessandro Cidronali, Kuldip Gupta, Jeffrey Jargon, Kate Remley, Donald C. DeGroot, Gianfranco Manes
This paper introduces a new technique which allows us to measure the admittance conversion matrix of a two-port device, using a large signal vector network analyzer. This method is applied to extract the conversion matrix of a 0.25 um PHEMT, driven by a 4

Multisine Excitation for ACPR Measurements

June 17, 2003
Author(s)
Catherine A. Remley
We use a simlator to compare ACPR measurements of a nonlinear device excited with various multisine signals to ACPR measurements of the same device excited with a QPSK-modulated pseudorandom digital signal. We examine four common types of multisine

Sampling Oscilloscope Models and Calibrations

June 17, 2003
Author(s)
Kate Remley, Dylan Williams
We discuss the basic principles of operation of electrical sampling oscilloscopes and describe circuit models developed to design, characterize, and help explain their operation. We survey common oscilloscope calibration schemes that correct for finite

Phase Detrending for Measured Multisine Signals

June 13, 2003
Author(s)
Kate Remley, Dylan Williams, Dominique Schreurs, Giovanni Loglio, Cidronali Alessandro
We develop a method to detrend the phases of measured multisine signals. We find a time reference that removes the linear component of the measured phases and aligns them to their expected values to the precision specified by the user. An initial guess is

Repeat Measurements and Metrics for Nonlinear Model Development

June 6, 2002
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.

Analytic Sampling-Circuit Model

June 1, 2001
Author(s)
Dylan F. Williams, Catherine A. Remley
Abstract: We develop analytic expressions for the impulse response and kickout pulses of a simple sampling circuit that incorporate the nonlinear junction capacitance of the sampling diode. We examine the effects of both the time-varying junction

A Method to Compare Vector Nonlinear Network Analyzers

May 1, 2001
Author(s)
Kate Remley, Donald C. DeGroot, Jeffrey Jargon, Kuldip Gupta
We address the difficult problem of determining measurement consistency between two vector nonlinear network analyzers, a new class of stimulus-response instruments that acquire multiharmonic waveform data instead of normalized network parameters. We

Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration

May 1, 2001
Author(s)
Kate Remley, Dylan Williams, Donald C. DeGroot, Jan Verspecht, John Kerley
We examine the effects of nonlinear diode junction capacitance on the fundamental premise of the noise-to-nose calibration, that the kickout is identical in shape to the impulse response of the sampler. We offer a physical explanation for the error

Realistic Sampling-Circuit Model for a Nose-to-Nose Simulation

June 1, 2000
Author(s)
Catherine A. Remley, Dylan F. Williams, Donald C. DeGroot
We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.

Nose-to-Nose Response of a 20-GHz Sampling Circuit

December 1, 1999
Author(s)
Dylan F. Williams, Catherine A. Remley, Donald C. DeGroot
We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impedance