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Search Publications by: Luis Miaja Avila (Fed)

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Displaying 1 - 25 of 51

Atom Probe Tomography Using an Extreme Ultraviolet Trigger Pulse

September 1, 2023
Author(s)
Benjamin Caplins, Ann Chiaramonti Debay, Jacob Garcia, Norman A. Sanford, Luis Miaja Avila
Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure of nanoscale specimens with atomic resolution. Modern APT instrumentation most often uses an

A tabletop x-ray tomography instrument for nanometer-scale imaging: demonstration of the 1,000-element transition-edge sensor subarray

August 1, 2023
Author(s)
Paul Szypryt, Nathan J. Nakamura, Dan Becker, Douglas Bennett, Amber L. Dagel, W.Bertrand (Randy) Doriese, Joseph Fowler, Johnathon Gard, J. Zachariah Harris, Gene C. Hilton, Jozsef Imrek, Edward S. Jimenez, Kurt W. Larson, Zachary H. Levine, John Mates, Daniel McArthur, Luis Miaja Avila, Kelsey Morgan, Galen O'Neil, Nathan Ortiz, Christine G. Pappas, Dan Schmidt, Kyle R. Thompson, Joel Ullom, Leila R. Vale, Michael Vissers, Christopher Walker, Joel Weber, Abigail Wessels, Jason W. Wheeler, Daniel Swetz
We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines a high spatial resolution scanning electron microscope (SEM) with a highly efficient and

An Algorithm for Correcting Systematic Energy Deficits in the Atom Probe Mass Spectra of Insulating Samples

April 15, 2020
Author(s)
Benjamin W. Caplins, Paul T. Blanchard, Ann C. Chiaramonti Debay, David R. Diercks, Luis Miaja Avila, Norman A. Sanford
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here we describe a post-processing technique developed to increase the quality of mass spectra of strongly insulating

Atom Probe Tomography using Extreme-Ultraviolet Light

March 27, 2020
Author(s)
Luis Miaja Avila, Ann C. Chiaramonti Debay, Benjamin W. Caplins, David R. Diercks, Brian Gorman, Norman A. Sanford
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an extreme-ultraviolet coherent light source to trigger eld ion emission at the tip's apex. The use of

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

March 12, 2020
Author(s)
Ann C. Chiaramonti Debay, Luis Miaja Avila, Benjamin W. Caplins, Paul T. Blanchard, Norman A. Sanford, Brian Gorman, David R. Diercks
This paper reports construction of an extreme ultraviolet (EUV) radiation-triggered atom probe tomograph and describes the results from initial experiments on amorphous SiO2. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon