February 4, 2015
Author(s)
Brandon M. Lane, Li Ma, Shawn P. Moylan, M A. Donmez, Eric P. Whitenton, Daniel J. Falvey
A major effort of the Measurement Science for Additive Manufacturing Program at NIST is to provide high quality, well-defined temperature measurement of the DMLS process to support and validate multi-physics simulations. However, the dynamic, complex