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Search Publications by: Marcus Mendenhall (Assoc)

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Displaying 26 - 44 of 44

Poisson errors and adaptive rebinning in X-ray Powder Diffraction Data

October 10, 2018
Author(s)
Marcus H. Mendenhall
Abstract This work provides a short summary of techniques for formally-correct handling of statistical uncertainties in Poisson- statistics dominated data. Correct assignment of uncertainties for low counts is documented. We describe a technique for

Certification of Standard Reference Material 1879b Respirable Cristobalite

July 27, 2018
Author(s)
David R. Black, Marcus H. Mendenhall, Pamela S. Whitfield, Craig Brown, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1879b, the third generation

High-precision measurement of the X-ray Cu K-alpha spectrum

May 12, 2017
Author(s)
Marcus H. Mendenhall, Albert Henins, Lawrence T. Hudson, Csilla I. Szabo-Foster, Donald A. Windover, James P. Cline
The structure of the x-ray emission lines of the Cu Kα complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 to 8100

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

May 11, 2017
Author(s)
Ernest G. Kessler Jr., Csilla Szabo-Foster, James Cline, Albert Henins, Lawrence T. Hudson, Marcus Mendenhall, Mark D. Vaudin
Precision lattice spacing comparison measurements at the National Institute of Standards and Technology (NIST) provide traceability of x-ray wavelength and powder diffraction standards to the international system of units (SI). Here we both summarize and

Certification of Standard Reference Material 1878b Respirable Alpha Quartz

June 9, 2016
Author(s)
David R. Black, Marcus H. Mendenhall, Pamela S. Whitfield, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1878b, the third generation

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration with NIST Standard Reference Materials

September 25, 2015
Author(s)
James P. Cline, Marcus H. Mendenhall, David R. Black, Donald A. Windover, Albert Henins
The laboratory X-ray powder diffractometer is one of the primary analytical tools in materials science. It is applicable to nearly any crystalline material, and with advanced data analysis methods, it can provide a wealth of information concerning sample

An algorithm for compensation of short-period errors in optical encoders

September 24, 2015
Author(s)
Marcus H. Mendenhall, Donald A. Windover, Albert Henins, James P. Cline
We present a simple way to collect data from an optical position or angle encoder with a readout which interpolates values between the optical features, and to process this data set so as to determine the short-range errors which arise from an

Certification of Standard Reference Material 1976b

September 15, 2015
Author(s)
David R. Black, Donald A. Windover, Marcus H. Mendenhall, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation