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Search Publications by: Jerome Cheron (Assoc)

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Displaying 26 - 41 of 41

Microwave Modeling and Characterization of Superconductive Circuits for Quantum Voltage Standard Applications at 4 Kelvin

February 10, 2020
Author(s)
Alirio De Jesus Soares Boaventura, Dylan F. Williams, Richard A. Chamberlin, Jerome G. Cheron, Anna E. Fox, Paul D. Dresselhaus, Peter F. Hopkins, Ian W. Haygood, Samuel P. Benz
We developed a cryogenic multiline thru-reflect-line (TRL) calibration kit for microwave characterizing of superconductive circuits used in the Josephson arbitrary waveform synthesizer of the national institute of standards and technology (NIST). We also

DARPA Organic Interconnect Characterization

January 27, 2020
Author(s)
Dylan Williams, Richard Chamberlin, Jerome Cheron, Sam Chitwood, Ken Willis, Brad Butler, Farhang Yazdani
We report on a study of interconnects fabricated on organic and silicon interposers used to connect state-of-the art digital, analog and RF chiplets commissioned by the U.S. Defense Advanced Research Projects Agency (DARPA). The interconnects were

Propagation of Compact-Modeling Measurement Uncertainty to 220 GHz Power-Amplifier Designs

November 5, 2018
Author(s)
Jerome Cheron, Dylan Williams, Konstanty Lukasik, Richard Chamberlin, Benjamin Jamroz, Erich N. Grossman, Wojciech Wiatr, Dominique Schreurs
We studied the impact of measurement uncertainties in a HBT model and their consequences on the electrical performance under large signal conditions at 9 GHz. Then we use the model with uncertainties to verify the ability of our model to accurately predict

On-Wafer Transistor Characterization to 750 GHz -the approach, results, and pitfalls

October 14, 2018
Author(s)
Dylan Williams, Jerome Cheron, Ben Jamroz, Richard Chamberlin
We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower

Measurement Challenges for 5G and Beyond

July 14, 2017
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Joshua A. Gordon, Alexandra E. Curtin, David R. Novotny, Christopher L. Holloway, Robert D. Horansky, Michael S. Allman, Jeanne T. Quimby, Camillo A. Gentile, Peter B. Papazian, Ruoyu Sun, Damir Senic, Jelena Senic, Matthew T. Simons, Maria G. Becker, Dylan F. Williams, Richard A. Chamberlin, Jerome G. Cheron, Ari D. Feldman, Paul D. Hale, Mohit S. Mujumdar, Nada T. Golmie
National Metrology Institutes (NMIs) around the world are charged with supporting industry through improved measurement science and by providing a traceability path to fundamental physical standards. Mobile wireless communications have become a ubiquitous

Model Verification with Measurement Uncertainty

November 1, 2016
Author(s)
Dylan F. Williams, Richard A. Chamberlin, Jerome G. Cheron, Wei Zhao, Urteaga Miguel
We verify a model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the model-extraction and verification process, and use them to

The Role of Measurement Uncertainty in Achieving First-Pass Design Success

October 22, 2016
Author(s)
Dylan Williams, Richard Chamberlin, Wei Zhao, Jerome Cheron, Urteaga Miguel
We investigate the role of measurement uncertainty in achieving first-pass design success at microwave frequencies. We develop a model for state-of-the-art 250 nm heterojunction bipolar transistors, and demonstrate the propagation of correlated measurement

Verification of a Foundry-Developed Transistor Model with Measurement Uncertainty

May 26, 2016
Author(s)
Dylan Williams, Richard Chamberlin, Wei Zhao, Jerome Cheron, Urteaga Miguel
We verify a foundry model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the verification process, and use them to quantify the