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Search Publications by: Ryan White (Fed)

Displaying 26 - 33 of 33

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

July 25, 2016

Author(s)

Ann C. Chiaramonti Debay, Ryan M. White, Jason D. Holm, Elisabeth Mansfield

Multi-walled carbon nanotubes (MWCNTs) play a significant role in the nascent nanotechnology industry, due to their remarkable combination of mechanical, thermal, and electrical properties. These materials are specialty additives, reinforcing a diverse

Near-theoretical fracture strengths in native and oxidized silicon nanowires

June 21, 2016

Author(s)

Frank W. DelRio, Ryan M. White, Sergiy Krylyuk, Albert Davydov, Lawrence H. Friedman, Robert F. Cook

In this letter, fracture strengths σf of native and oxidized silicon nanowires (SiNWs) were determined via atomic force microscopy bending experiments and nonlinear finite element analysis. In the native SiNWs, σf in the Si was comparable to the

Firearm Serial Number Restoration with Electron Backscatter Diffraction

September 23, 2015

Author(s)

Ryan White, Robert Keller

N/A (manuscript is abstract)

Restoration of firearm serial numbers with electron backscatter diffraction (EBSD)

February 9, 2015

Author(s)

Ryan White, Robert Keller

Firearm serial numbers are a critical identifying mark, and restoration of destroyed serial numbers is often crucial for prosecution of a criminal case. Currently available methods, including acid etching and relief polishing, present serious limitations