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Search Publications by: Jason Holm (Fed)

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Displaying 1 - 21 of 21

Transmission Electron Imaging and Diffraction of Asbestos Fibers in an SEM

July 24, 2024
Author(s)
Jason Holm, Elisabeth Mansfield
Asbestos, a known carcinogen, can be found in consumer products ranging from building materials to textiles. While most of the products are no longer produced domestically, the release of asbestos fibers from these and other non-anthropogenic sources into

Detailed analysis of the synthesis and structure of MAX phase (Mo0.75V0.25)5AlC4 and its MXene (Mo0.75V0.25)5C4

June 27, 2023
Author(s)
Rose Snyder, Mikkel Juelsholt, Curran Kalha, Jason Holm, Elisabeth Mansfield, Tien-Lin Lee, Pardeep Thakur, Aysha Riaz, Benjamin Moss, Anna Regoutz, Christina Birkel
MAX phases with the general formula Mn+1AXn are layered carbides, nitrides and carbonitrides with varying stacking sequence of layers of M6X octahedra and the A-element depending on n. While "211" MAX phases (n = 1) are very common, MAX phases with higher

Orientation Mapping of Graphene Using 4D STEM-in-SEM

October 13, 2020
Author(s)
Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning transmission electron microscopy in the scanning electron microscope), collects a diffraction

Grain Orientation Mapping of Graphene in a Scanning Electron Microscope

May 1, 2019
Author(s)
Benjamin W. Caplins, Jason D. Holm, Robert R. Keller
A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational imaging microscopy of 2D materials. The method can generate grain orientational maps of monolayer graphene over a field of

Transmission Imaging with a Programmable Detector in a Scanning Electron Microscope

September 13, 2018
Author(s)
Benjamin W. Caplins, Jason D. Holm, Robert R. Keller
A new type of angularly selective electron detector for use in a scanning electron microscope is presented. The detector leverages a digital micromirror device (DMD) to take advantage of the benefits of two-dimensional (2D) imaging detectors and high

Acceptance Angle Control for Improved Transmission Imaging in an SEM

March 1, 2017
Author(s)
Jason D. Holm, Robert R. Keller
This contribution presents a simple, cost-effective modular aperture system enabling comprehensive acceptance angle control for STEM-in-SEM imaging. The system is briefly described, and different ways to use it are explained. To demonstrate the utility of

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

July 25, 2016
Author(s)
Ann C. Chiaramonti Debay, Ryan M. White, Jason D. Holm, Elisabeth Mansfield
Multi-walled carbon nanotubes (MWCNTs) play a significant role in the nascent nanotechnology industry, due to their remarkable combination of mechanical, thermal, and electrical properties. These materials are specialty additives, reinforcing a diverse

Angularly-Selective Transmission Imaging in a Scanning Electron Microscope

May 5, 2016
Author(s)
Jason D. Holm, Robert R. Keller
This contribution presents recent advances in imaging control conditions for transmission scanning electron microscopy (t-SEM) by means of angularly-selective electron collection with a commercial scanning transmission electron microscopy-in-scanning