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Search Publications by: Robert Ilic (Fed)

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Displaying 1 - 25 of 85

Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield

March 18, 2024
Author(s)
Craig R. Copeland, Adam L. Pintar, Ronald G. Dixson, Ashish Chanana, Kartik Srinivasan, Daron Westly, Robert Ilic, Marcelo Davanco, Samuel M. Stavis
In a popular integration process for quantum information technologies, localization microscopy of quantum emitters guides lithographic placement of photonic structures. However, a complex coupling of microscopy and lithography errors degrades registration

Beating thermal noise in a dynamic signal measurement by a nanofabricated cavity-optomechanical sensor

March 15, 2023
Author(s)
Mingkang Wang, Diego Perez Morelo, Georg Ramer, Georges Pavlidis, Jeffrey Schwartz, Liya Yu, Robert Ilic, Andrea Centrone, Vladimir Aksyuk
Thermal fluctuations often impose both fundamental and practical measurement limits on high-performance sensors, motivating the development of techniques that bypass the limitations imposed by thermal noise outside cryogenic environments. Here, we

High throughput nanoimaging of thermal conductivity and interfacial thermal conductance

May 17, 2022
Author(s)
Mingkang Wang, Georg Ramer, Diego Perez, Georges Pavlidis, Jeffrey Schwartz, Liya Yu, Robert Ilic, Vladimir Aksyuk, Andrea Centrone
Thermal properties of materials are often determined by measuring thermalization processes. Measuring such properties at the nanoscale, however, requires high sensitivity, high temporal, and high spatial resolutions concurrently, which is beyond the

Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy

December 20, 2021
Author(s)
Lindsay C. C. Elliott, Adam L. Pintar, Craig R. Copeland, Thomas Brian Renegar, Ronald G. Dixson, Robert Ilic, R. Michael Verkouteren, Samuel M. Stavis
Volumetric analysis of single microdroplets is difficult to perform by ensemble gravimetry, whereas optical microscopy is often inaccurate beyond the resolution limit. To address the latter issue, we advance and integrate these complementary methods

Accurate localization microscopy by intrinsic aberration calibration

June 24, 2021
Author(s)
Craig Copeland, Craig McGray, Robert Ilic, Jon Geist, Samuel Stavis
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard

Comparable Enhancement of TERS signals from WeSe2 on Chromium and Gold.

April 6, 2020
Author(s)
Albert Davydov, Sergiy Krylyuk, Angela R. Hight Walker, Bojan R. Ilic, Andrey Krayev, Ashish Bhattarai, Alan G. Joly, Matej Velicky, Patrick Z. El-Khoury
Plasmonic tip-sample junctions, at which the incident and scattered optical fields are localized and optimally enhanced, are often exploited to achieve ultrasensitive and highly spatially localized tip-enhanced Raman scattering (TERS). Recent work has