May 17, 2022
Author(s)
Mingkang Wang, Georg Ramer, Diego Perez, Georges Pavlidis, Jeffrey Schwartz, Liya Yu, Robert Ilic, Vladimir Aksyuk, Andrea Centrone
Thermal properties of materials are often determined by measuring thermalization processes. Measuring such properties at the nanoscale, however, requires high sensitivity, high temporal, and high spatial resolutions concurrently, which is beyond the