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Search Publications by: Stephanie Moffitt (Fed)

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Displaying 1 - 6 of 6

PVDF-based Backsheet Cracking: Mapping In Situ Phase Evolution by X-ray Scattering

December 15, 2024
Author(s)
Stephanie Moffitt, Sona Ulicna, Song-Syun Jhang, Po-Chang Pan, Michael Owen-Bellini, Peter Hacke, Michael Kempe, Jared Tracy, Kaushik Choudhury, Laura Schelhas, Xiaohong Gu
One of the most common polymers in commercial photovoltaic (PV) backsheets is polyvinylidene fluoride (PVDF). However, recent reports have shown the potential for PVDF-based backsheets to crack and fail prematurely. Previous work has suggested that polymer

Instrument Development for Spectroscopic Ellipsometry and Diffractometry in the EUV

April 24, 2024
Author(s)
Stephanie Moffitt, Bryan Barnes, Thomas A. Germer, Steven Grantham, Eric Shirley, Martin Sohn, Daniel Sunday, Charles S. Tarrio
Semiconductor devices are noted for ever-decreasing dimensions but now are also becoming more complex. While scanning probe microscopy can still resolve the smallest features, it does not have the throughput for high-volume characterization of full wafers

Electrical and Electroluminescence Evaluation of 17 Year Old Monocrystalline Silicon Building Integrated Photovoltaic Modules

December 25, 2023
Author(s)
Andrew Shore, Tali Schlenoff, Bakary Coulibaly, David Navon, Stephanie Moffitt, Brian P. Dougherty, Behrang Hamadani
Longterm reliable operation of photovoltaic modules is necessary to ensure the technology is key to reducing the cost of solar energy. However, degradation mechanisms in the field are not always consistent or predictable. We present a dataset of 72

NIST efforts in extreme-ultraviolet metrology

November 21, 2023
Author(s)
Charles S. Tarrio, Steven Grantham, Rob Vest, Thomas A. Germer, Bryan Barnes, Stephanie Moffitt, Brian Simonds, Matthew Spidell
For several decades, the National Institute of Standards and Technology (NIST) has actively supported metrology programs for extreme ultraviolet (EUV) lithography. We will describe our existing programs in optics lifetime, reflectometry, and radiometry

Microstructure changes during failure of PVDF-based photovoltaic backsheets

July 21, 2022
Author(s)
Stephanie Moffitt, Po-Chang Pan, Lakesha Perry, Michael Kempe, Jared Tracy, Kaushik Choudhury, Xiaohong Gu
The backsheet layer of a solar module provides a safety and environmental barrier to the high voltages running through the photovoltaic (PV) cells and electrical contacts within the core of the module. However, in the past decade, backsheet cracking has