Seiler, D.
and Secula, E.
(2003),
Semiconductor Electronics Division, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 31, 2024)
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Semiconductor Electronics Division
Published
Author(s)
,
Abstract
This is a high-level, full-color brochure detailing the activities and challenges of the Semiconductor Electronics Division. Topics include Division history, nanotechnology, MEMS, electrical test structures, power electronics, optical and electrical measurements, gate dielectrics, and super transistors.Citation
NIST Interagency/Internal Report (NISTIR) -
NIST Pub Series
Pub Type
NIST Pubs
Keywords
mems, nanotechnology, semiconductor, test structures, transistors
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 29, 2003, Updated October 12, 2021