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PUBLICATIONS

SERIES RESISTANCE: A MONITOR FOR HOT CARRIER STRESS

Published

Author(s)

Jason P. Campbell, Serghei Drozdov, Kin P. Cheung, Richard G. Southwick, Jason T. Ryan, John S. Suehle, Anthony Oates

Abstract

In this work, we examine a series resistance extraction technique which yields accurate values from single nano-scale devices. The series resistance values, derived from this extraction technique, are shown to be sensitive to hot carrier degradation and might possibly serve as new technique to monitor reliability in advanced devices.
Proceedings Title
2012 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 14-18, 2012
Conference Location
S. Lake Tahoe, CA
Conference Title
2012 IEEE International Integrated Reliability Workshop
Pub Type
Conferences
Polymers

Citation

Campbell, J. , Drozdov, S. , Cheung, K. , Southwick, R. , Ryan, J. , Suehle, J. and Oates, A. (2013), SERIES RESISTANCE: A MONITOR FOR HOT CARRIER STRESS, 2012 IEEE International Integrated Reliability Workshop Final Report, S. Lake Tahoe, CA (Accessed November 23, 2024)

Issues

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Created January 31, 2013, Updated February 19, 2017