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Simplified motional heating rate measurements of trapped ions

Published

Author(s)

Ryan Epstein, Signe Seidelin, Dietrich G. Leibfried, Janus Wesenberg, John J. Bollinger, Jason Amini, Brad R. Blakestad, Joseph W. Britton, Jonathan Home, Wayne M. Itano, John D. Jost, Emanuel H. Knill, C. Langer, R. Ozeri, Nobuyasu Shiga, David J. Wineland

Abstract

We measure motional heating rates of trapped atomic ions, a factor that influences multi-ion quantum logic gate fidelities. Two simplified techniques are developed for this purpose: one relies on Raman sideband detection implemented with a single laser source, while the second is even simpler and based on time-resolved fluorescence detection during Doppler recooling. We apply these methods to a microfrabricated surface-electrode trap, made of gold on fused quartz, which traps ions 40~$\mu$m above its surface. Heating rates obtained from the two techniques are found to be in reasonable agreement. In addition, the trap gives rise to a heating rate of $300\pm30$~quanta/s for a motional frequency of 5.25~MHz, substantially below the trend observed in other traps.
Citation
Physical Review A (Atomic, Molecular and Optical Physics)
Volume
76
Issue
033411

Keywords

atom, cool, Doppler, heating, ion, rate, surface, trap

Citation

Epstein, R. , Seidelin, S. , Leibfried, D. , Wesenberg, J. , Bollinger, J. , Amini, J. , Blakestad, B. , Britton, J. , Home, J. , Itano, W. , Jost, J. , Knill, E. , Langer, C. , Ozeri, R. , Shiga, N. and Wineland, D. (2007), Simplified motional heating rate measurements of trapped ions, Physical Review A (Atomic, Molecular and Optical Physics), [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50576 (Accessed November 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 19, 2007, Updated January 27, 2020