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A Simulation-Based Approach to Assess Condition Monitoring-Enabled Maintenance in Manufacturing

Published

Author(s)

Mehdi Dadfarnia, Serghei Drozdov, Michael Sharp, Jeffrey Herrmann

Abstract

Industrial Condition Monitoring Systems (CMSs) collect and evaluate system and equipment operations to support control and decision-making. Despite their usefulness, understanding the full implications of their impact presents unique and unexpected challenges, especially on new manufacturing systems. System configuration and operational procedures have significant impact on CMS capability and performance. Thus, evaluating a CMS in context of the application is essential both prior to and during deployment. We developed a discrete-event simulator to analyze scenarios with arbitrary manufacturing system configurations and typical operation policies to address this need. This paper describes the results of a study that uses our simulation model to assess the benefits and risks of a CMS selection. We evaluated CMSs with various manufacturing system configurations and maintenance policies to observe how the CMS affected manufacturing system performance. We also discuss the selection of metrics, focusing on the alignment between CMS performance metrics and manufacturing performance indicators.
Proceedings Title
International Conference on System Reliability and Safety
Conference Dates
November 22-24, 2023
Conference Location
Bologna, IT
Conference Title
2023 7th International Conference on System Reliability and Safety (ICSRS)

Keywords

condition monitoring, manufacturing systems, maintenance, performance metrics

Citation

Dadfarnia, M. , Drozdov, S. , Sharp, M. and Herrmann, J. (2024), A Simulation-Based Approach to Assess Condition Monitoring-Enabled Maintenance in Manufacturing, International Conference on System Reliability and Safety, Bologna, IT, [online], https://doi.org/10.1109/ICSRS59833.2023.10381326, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956665 (Accessed December 30, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 8, 2024, Updated January 10, 2024