Goodrich, L.
and Srivastava, A.
(1990),
Software techniques to improve data reliability in superconductor and low-resistance measurements, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905872
(Accessed December 3, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Software techniques to improve data reliability in superconductor and low-resistance measurements
Published
Author(s)
, A N. Srivastava
Citation
Journal of Research (NIST JRES) -
Volume
95
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 1, 1990, Updated November 14, 2018