DeRocher, K.
, McLean, M.
and Meisenkothen, F.
(2022),
A Standards-based Approach to Dopant Quantification Using Atom Probe Tomography, Microscopy and Microanalysis , Portland, OR, US, [online], https://doi.org/10.1017/S1431927622003373, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934367
(Accessed November 23, 2024)
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A Standards-based Approach to Dopant Quantification Using Atom Probe Tomography
Published
Author(s)
, ,
Proceedings Title
Microscopy and Microanalysis
Volume
28
Conference Dates
July 31-August 4, 2022
Conference Location
Portland, OR, US
Pub Type
Conferences
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Created July 22, 2022, Updated February 17, 2023