Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Suppression of Flux Jumps in Marginally Stable Niobium-Tin Superconductors

Published

Author(s)

Ronald B. Goldfarb, Loren F. Goodrich, T Pyon, E. A. Gregory

Abstract

Niobium-tin superconductor wires with coalesced filaments may have reduced adiabatic stability. Magnetization measurements on such marginally stable conductors exhibit flux jumps, which appear as a sudden decrease in magnetization as the applied field is changed, caused by the unpinning of flux vortices and resistive heat generation. Flux jumps preclude estimation of the hysteresis loss from the area of the magnetization-versus-field loop. Here, we show that flux jumps can be minimized or suppressed during the measurement of hysteresis loss by immersing the specimen in helium liquid instead of helium gas. The better thermal conductivity of the liquid affords additional dynamic stability against flux jumps. This allows one to determine the loss upon field cycling and to calculate an effective filament diameter, often used to gauge losses and the extent of metallurgical interfilament coupling.
Citation
IEEE Transactions on Applied Superconductivity
Volume
11
Issue
1

Keywords

AC losses, flux jumps, hysteresis losses, magnetization measurements, niobium-tin superconductors, superconductor stability

Citation

Goldfarb, R. , Goodrich, L. , Pyon, T. and Gregory, E. (2001), Suppression of Flux Jumps in Marginally Stable Niobium-Tin Superconductors, IEEE Transactions on Applied Superconductivity, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30194 (Accessed November 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 28, 2001, Updated October 12, 2021