Craig, J.
, Lee, D.
, Parker, R.
, Biancaniello, F.
and Ridder, S.
(1999),
Temperature Imaging Measurements With a Two Wavelength Imaging Pyrometer, Proceedings of the ASM Heat Treating Society Conference, Undefined
(Accessed November 8, 2024)
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Temperature Imaging Measurements With a Two Wavelength Imaging Pyrometer
Published
Author(s)
J E. Craig, D Lee, R A. Parker, ,
Abstract
An innovative two-wavelength, imaging pyrometer with analysis software provides a method to monitor process uniformity, improve quality and reduce cost in advanced materials processing techniques. The design has achieved high imaging quality and the system measures true surface temperatures of hot objects including surfaces with roughness or emissivity variation. The measurements were made in a material processing lab and calibration results are described. Two-wavelength measurements were found to achieve high accuracy, 1.0 % of the measured value, over the range of 1000 K to 3000 K.Proceedings Title
Proceedings of the ASM Heat Treating Society Conference
Conference Dates
October 12-15, 1998
Conference Location
Undefined
Conference Title
ASM Heat Treating Society Conference
Pub Type
Conferences
Keywords
automization, control, emissivity, materials processing, monitor, pyrometry, spray forming
Citation
Issues
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Created March 31, 1999, Updated October 12, 2021