Chbili, Z.
, Cheung, K.
, Campbell, J.
, Chbili, J.
, Lahbabi, M.
, Ioannou, D.
and Matocha, K.
(2016),
Time Dependent Dielectric Breakdown in high quality SiC MOS capacitors, Silicon Carbide and Related Materials , Giardini Naxos, IT
(Accessed April 8, 2025)
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Time Dependent Dielectric Breakdown in high quality SiC MOS capacitors
Published
Author(s)
, , , , Mhamed Lahbabi, D. E. Ioannou, Kevin Matocha
Proceedings Title
Silicon Carbide and Related Materials
Volume
858
Conference Dates
October 4-9, 2015
Conference Location
Giardini Naxos, IT
Conference Title
International Conference on Silicon Carbide and Related Materials 2015
Pub Type
Conferences
Citation
Issues
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Created May 23, 2016, Updated April 1, 2022