Marks, R.
and Williams, D.
(1992),
Traceability for On-Wafer MMIC Measurements, Proc., Conf. Prec. Electromagn. Meas., Paris, 1, FR
(Accessed April 10, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Traceability for On-Wafer MMIC Measurements
Published
Author(s)
,
Proceedings Title
Proc., Conf. Prec. Electromagn. Meas.
Conference Dates
June 9-12, 1992
Conference Location
Paris, 1, FR
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1992, Updated October 12, 2021