Montgomery, K.
, Candell, R.
and Hany, M.
(2023),
Uncertainty Analysis of the Dual-Lift Use Case for the Industrial Wireless Testbed, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2270, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956530
(Accessed December 18, 2024)