Understanding and Evaluating Naive Diagnostics Algorithms Applicable in Multistage Manufacturing from a Risk Management Perspective

Published

June 21, 2020

Author(s)

Mehdi Dadfarnia, Michael Sharp, Timothy A. Sprock

Abstract

The world has entered a state of unprecedented access to machine intelligence algorithms, where the ease of deployment has created a scenario where nearly every facet of life and industry has been affected by AI. Especially within industry, where the options for enacting AI systems are wide and varied, the choice of which system will work best for a given application can be daunting. Understanding when, where, and why to apply a particular algorithm can provide competitive advantage on effectiveness as well as greater trust and justification when using the algorithms'outputs. This paper examines multistage manufacturing processes, where system complexity can greatly influence the burden of creating custom tailored monitoring solutions. Such barriers have encouraged many small and medium enterprises (SME) sized manufactures to look towards generic 'black box' solutions that they may or may not have sufficient expertise to objectively judge which commercial product would be best for them. Some of the considerations faced by SMEs is identifying tools that can successfully be deployed alongside a potential of lack of sensor coverage and/or the desire for rapid system reconfiguration to accommodate smaller custom batch production sizes. In these environments, detailed analytics-based solutions are often not feasible for production equipment monitoring. This paper provides a procedure for assessing the suitability of various tools or algorithms used to evaluate production process performance based on product quality output. This paper also presents a preliminary comparative example study of several algorithms to demonstrate this process and evaluate the selected algorithms.

Conference Dates

June 22-26, 2020

Conference Location

Cincinnati, OH, US

Conference Title

ASME Manufacturing Science and Engineering Conference 2020 (MSEC 2020)

Pub Type

Conferences

Download Paper

https://doi.org/10.1115/MSEC2020-8430

Local Download

Keywords

multistage manufacturing, fault detection, algorithm evaluation

Citation

Dadfarnia, M. , Sharp, M. and Sprock, T. (2020), Understanding and Evaluating Naive Diagnostics Algorithms Applicable in Multistage Manufacturing from a Risk Management Perspective, ASME Manufacturing Science and Engineering Conference 2020 (MSEC 2020), Cincinnati, OH, US, [online], https://doi.org/10.1115/MSEC2020-8430, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929363 (Accessed December 3, 2024)