X-Ray and EUV Emission Induced by Variable Pulsewidth Irradiation of Ar and Kr Clusters and Droplets

Published

October 16, 2008

Author(s)

E Parra, I Alexeev, J Fan, K Kim, S J. McNaught, H M. Milchberg

Abstract

Measurements are presented of X-ray (>1.5 keV) and extreme ultraviolet (EUV, 8 = 2 - 44 nm) emission from Argon and Krypton supersonic gas jets at room (T = 300 K) and cryogenic (T = 173 K) temperatures irradiated with constant energy (50mJ), variable width laser pulses ranging from 100 fs to 10 ns. Two regimes of jet operation are explored: cluster formation (radius<100nm) and droplet formation (radius>1:m). The results for both clusters and droplets can be understood in terms of two time scales: a short time scale for optimal resonant absorption at the critical density layer in the expanding plasma, and a longer time scale for the plasma to drop below critical density.

Citation

Physical Review E (Statistical, Nonlinear, and Soft Matter Physics)

Pub Type

Journals

Keywords

atomic clusters, extreme ultraviolet emission, intense laser pulses, laser-cluster interactions, plasmas, supersonic gas jet, vriable pulse width, x-ray emission

Citation

Parra, E. , Alexeev, I. , Fan, J. , Kim, K. , McNaught, S. and Milchberg, H. (2008), X-Ray and EUV Emission Induced by Variable Pulsewidth Irradiation of Ar and Kr Clusters and Droplets, Physical Review E (Statistical, Nonlinear, and Soft Matter Physics) (Accessed October 22, 2025)