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Materials
Material SRDs by Subtopic
Surface Data
| NIST X-ray Photoelectron Spectroscopy Database This database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron spectral lines, and is searchable by element, line type, line energy, and many other variables. Read More |
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| SRD 64 |
NIST Electron Elastic-Scattering Cross-Section Database |
| SRD 71 |
NIST Electron Inelastic-Mean-Free-Path Database |
| SRD 82 | NIST Electron Effective-Attenuation-Length Database This database provides values of electron-effective attenuation lengths in solid elements and compounds at selected electron energies for surface analysis by Auger-electron spectroscopy and X-ray photoelectron spectroscopy. Read More |
| SRD 100 |
NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) |
| SRD 154 | NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy This database contains values of backscattering correction factors of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. Read More |
| SRD 164 |
NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Positron Impact
This database provides cross-sections for ionization of the K shell and of the L and M sub-shells in neutral atoms of the elements, from hydrogen to einsteinium, by electron and positron impact. Read More |