TY  - CONF
AU  - Bennett, Marylyn
AU  - Guerry, Angela
AU  - Dixson, Ronald
AU  - Postek, Michael
AU  - Vorburger, Theodore
C2  - Proceedings of SPIE, Metrology, Inspection, and Process Control for Microlithography XVI, Daniel J. C. Herr, Editor, Santa Clara, CA, USA
DA  - 2003-07-01 00:07:00
LA  - en
M1  - 4689
PB  - Proceedings of SPIE, Metrology, Inspection, and Process Control for Microlithography XVI, Daniel J. C. Herr, Editor, Santa Clara, CA, USA
PY  - 2003
TI  - Toward Traceability for At-line AFM Dimensional Metrology
ER  -