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RF Technology Division

The RF Technology Division provides metrology resources to facilitate development and commercialization of a broad range of radio-frequency electronic and electromagnetic technologies.

 

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WHO WE ARE

The National Institute of Standards and Technology Communications Technology Laboratory (NIST CTL) Radio Frequency (RF) Technology Division develops theory, metrology, and standards for the technologies that drive the future of communications. Its work spans from measurements to support traceability of fundamental RF quantities, to on-chip measurements of integrated circuits, testing of free-field signals and the antennas that send and receive them. The RF Technology Division tackles fundamental RF measurement problems applicable to a wide array of industry and government players and contribute to the CTL Fundamental Metrology for Communications program.

MEETING INCREASED DEMAND

An added challenge is that wireless systems of all sorts must operate in increasingly crowded, complex RF environments. In part, this is a function of inexorable wireless demand growth. But there are also concerted efforts – in particular with spectrum sharing – to squeeze more users into the same spectrum bands.

CUTTING-EDGE TECHNOLOGY

For decades, NIST have been developing new theories, algorithms, software, and hardware to advance the metrological state-of-the-art for the U.S. wireless industry. The RF Technology Division continues to invent new ways to accomplish this mission, including the first robotic-arm antenna testing system, the electro-optic sampling system for on-chip metrology, the quantum field probe for antenna testing, and the new NIST Broadband Interoperability Test Bed (NBIT), among others. As the longstanding collaborations with the wireless industry identify new focus areas for the unique CTL capabilities, this list will continue to grow.

 

News and Updates

Projects

5G & Beyond

Ongoing
The realization of this long-term vision requires tackling key technical challenges to allow for greater temporal, spectral, coding and spatial resource efficiency. As well, these technologies all rely on high levels of electronic device integration, yielding a radical new connectorless measurement

A measurement-based approach to 5G supply chain security

Ongoing
NIST is working with a multidisciplinary group of stakeholders to define both the cybersecurity standards for 5G and beyond hardware and to secure the supply chain through developing technology that can detect corrupted hardware before it is put in use.  For an overview of NIST cybersecurity and

Advanced Materials Metrology

Ongoing
Electromagnetic devices cannot operate without the interaction of electromagnetic waves with materials, and the characterization of the interface between fields and materials will be a critical task for any device or metrology development from nanoscale to larger scales. Areas of impact over the

Antenna Metrology Project

Ongoing
NIST CTL’s Antenna Metrology Project combines theoretical models, analytical tools, and custom-developed facilities to advance the field of antenna measurement and share those advances with industry, government, and academic users. Two generations ago, NIST pioneered the near-field scanning

Awards

Contacts