Charging
Negative charge accumulation on either a nonconductive sample or a sample that is not properly grounded. DiscussionThis effect can interfere with image formation and X-ray analysis because of beam deflection. It can usually be eliminated by the application of a conductive coating or by the use of a low vacuum system.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2022.
Source link
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org