Detector Fluorescence Peak (Dead-Layer Peak, Silicon Internal Fluorescence Peak)
Peak resulting from the emission of characteristic X-rays in a thin layer of inactive crystal area in the front of an EDS detector
Committee
Interdisciplinary
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024.
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org