Escape Peak
A peak resulting from incomplete deposition of the energy of an X-ray entering the energy dispersive X-ray spectrometer detector. DiscussionThis peak is produced when an incoming X-ray excites a silicon atom within the detector crystal, and the resulting Si K-_ fluorescence X-ray exits the detector crystal. It occurs at the principal peak energy minus the energy of the Si K-_ fluorescence X-ray (1.74 keV). The escape peak intensity is about 1 to2%ofthe parent peak.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2022.
Source link
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org