Scanning Electron Microscopy (Sem)
Type of electron microscope in which a focused electron beam is scanned in a raster on a solid sample surface
Committee
Interdisciplinary
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024.
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org