Variable Pressure Scanning Electron Microscopy (Lv, Cp, Vp, Esem)
Type of SEM that is designed to operate at higher chamber pressure than the conventional in which the need for application of a conductive coating is minimized when using a variable pressure SEM; however, EDS may be complicated because of the electron beam spread experienced at higher operating pressures
Committee
Interdisciplinary
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732-24 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2024.
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org