Diffraction Peaks
spectral artifacts that result from preferential diffraction of tube X-rays into the detector as a result of striking a crystalline sample.
Discussion—Diffraction peaks vary in energy and intensity depending on orientation of the crystalline planes with respect to the beam angle.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E3295-23 Standard Guide for Using Micro X-Ray Fluorescence (μ-XRF) in Forensic Polymer Examinations. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428 , 2023.
Source link
Reprinted, with permission, from ASTM, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard may be purchased from ASTM International, https://www.astm.org