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Projects/Programs

Displaying 1 - 7 of 7

Evaluation of 2D and WBG Material Quality Toward Device Reliability

Ongoing
Two-dimensional (2D) and wide band gap (WBG) materials are some of the latest materials classes having the potential to be transformative because of their high carrier mobilities, tunable bandgap, and atomic-scale film thicknesses. Unexpected degradation and failure in device performance is often

Farad and Impedance Metrology

Ongoing
The primary facility for connecting the U.S. legal system of electrical units to the international system of units is the NIST calculable capacitor, with which the measurement of capacitance is effectively achieved through a measurement of length. Both the calculable capacitor and the chain of high

Metrology of the Ohm

Ongoing
The Metrology of the Ohm Project has been a leader in providing internationally consistent resistance standards that are readily available to support the scientific and industrial foundations of the U.S. economy. Through this very broad customer base, the activities of the project enable cost

Optical Probes of 2D Magnetic Phenomena

Ongoing
The unique measurement capabilities developed in this Project enable diffraction-limited, optical spectra (both Raman and photoluminescence) to be collected and analyzed as a function of laser energy, polarization, temperature, magnetic field, and device parameters such as current load and back

Precision Electro-Mechanical Experiments (PREME)

Ongoing
NIST-4 Kibble Balance Previously called ‘the Electronic Kilogram’ Project, a major component of PREME is the realization of SI unit of mass, the kilogram, using the NIST-4 Kibble balance, the fourth generation of Kibble balances at NIST. This is accomplished through a high-accuracy comparison of

Quantum Conductance

Ongoing
Inset: Example of an array device design. (a) An illustration of the graphene quantized Hall array resistance device with NbTiN interconnections (dark grey) between individual QHR elements (light grey) and the positions of the bonding wires that were used for the measurement (blue). The red inset

Raman Metrology and Instrumentation

Ongoing
Raman spectroscopy/microscopy is a powerful optical technique for rapid, non-destructive, label-free characterization of materials. It works under ambient conditions, often without requirement of any sample preparation. Applications span microelectronics, pharmaceutical, security and fundamental