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Projects/Programs: Grand Challenge 1: Metrology for Materials Purity, Properties, and Provenance

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A time series of a MoS2 flake exposed to increasing time under electrical stress shows the growth of defects denoted with red and yellow areas over time. S= source and D = drain electrode.

Evaluation of 2D and WBG Material Quality Toward Device Reliability

Ongoing
Two-dimensional (2D) and wide band gap (WBG) materials are some of the latest materials classes having the potential to be transformative because of their high carrier mobilities, tunable bandgap, and atomic-scale film thicknesses. Unexpected degradation and failure in device performance is often
Metrology is the foundation of the entire semiconductor enterprise. Standards provide the highest “value added” of all processes.

Metrology of Purity and Contaminants in Solid Materials

Ongoing
Purity evaluations of high-purity bulk materials used in chips manufacturing are calibrated against reference materials that are often not matrix-matched to the materials under test. In other words, differences in the compositions of the calibrants and the samples being analyzed can result in large