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Materials

Materials characterization

Projects/Programs

Displaying 51 - 75 of 79
Spectroscopic ellipsometry measurement of a 2D monolayer and the optical property for such a thin layer.

Optical and Optoelectronic Materials Characterization

Ongoing
Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts

Personal Body Armor

Completed
To quantify the impact of mechanical degradation on ballistic fibers, NIST developed a novel device for controlled folding of yarns and woven fabrics. In addition, we developed test protocols that employ single fibers to assess the effect of folding using a recently developed modified single fiber
Materials Extrusion Additive Manufacturing

Polymer Additive Manufacturing and Rheology

Ongoing
We are measuring the fundamental processes and material parameters that are critical to understanding and furthering polymers-based AM. These efforts will aid the AM ecosystem through better online monitoring capabilities and developing strategies for materials optimization. In situ measurements of

Polymer Formulations

Completed
Bringing new and optimized formulated products to market requires measurements that will allow rapid assessment of the structure and properties of multicomponent mixtures over large parameter spaces. To this end, we are developing microfluidic "lab on a chip" technologies that enable researchers to
Schematic of selective transport of water, ions, or molecules across a polymer membrane.

Polymer Membranes

Ongoing
We are developing and applying the following advanced tools to measure the structure, dynamics, and performance of polymer-based membranes and sorbents: Vibrational Spectroscopy We have developed a custom-built tandem quartz crystal microbalance (QCM), which measures total mass uptake of adsorbed
Picture of PBD set up for wavelength measurement

Powder Diffraction SRMs

Ongoing
This program strives to produce the highest-quality, traceable powders and other artifacts for x-ray diffraction calibration. (to be completed)
Image of PBD 3-bounce crystals

Precision X-ray Emission Line Measurements

Ongoing
Precise knowledge of the shape and position of x-ray emission lines is the basis of connecting x-ray diffraction measurements to the Système Internationale d'Unités (SI), the official worldwide standard for making any measurement. Measurements of position of x-ray emission lines have been made been

Radioanalytical Metrology

Ongoing
The Group engages in a wide range of methods applicable to the detection and characterization of nuclear materials. The work can benefit environmental studies, waste remediation, naturally occurring radioactivity detection and characterization and general radioanalytical metrology. Expertise in

Raman Metrology and Instrumentation

Ongoing
Raman spectroscopy/microscopy is a powerful optical technique for rapid, non-destructive, label-free characterization of materials. It works under ambient conditions, often without requirement of any sample preparation. Applications span microelectronics, pharmaceutical, security and fundamental
CNT_interconnect_failure

Reliability Metrologies for Advanced Electronic Interconnects

Completed
High-performance devices, such as microprocessors and memory chips, are typically composed of structures with strict dimensional tolerances and geometries and are made up of various materials, all in close proximity in a three-dimensional system. Material interactions lead to reliability issues such

Secondary Ion Mass Spectrometry Ion Source Development

Ongoing
In SIMS, a typical analysis requires <1% of the surface to be sampled, which minimizes chemical damage in the form of molecular fragmentation due to energetic ion bombardment. Cluster sources such as C 60 and Ar GCIB allow for efficient removal of the damage volume, and by operating the analysis and
Photograph of SRM 3103a showing a labeled clear glass ampoule and labeled box against a blue background.

Standard Solution SRMs Provide Traceability for Millions of Measurements

Ongoing
Literally millions of measurements of elemental composition are performed each year worldwide. The vast majority of these measurements depend upon reference materials for establishing traceability of results to the SI. Leveraged through commercial CRM producers, the NIST SRM 3100 series provides an
Breathalyzer

Standards Development to Ensure Reliable Breath Analysis in the Field

Ongoing
Numerous volatile organic compounds (VOCs) have been identified in human breath. These compounds can be produced by the body or by organisms in the body (e.g., bacteria or viruses) and provide a non-invasive window into human health. Inexpensive point-of-care devices are being developed to diagnose

Structural Metrology of Advanced Manufacturing Processes

Ongoing
Understanding material structures in advanced manufacturing is crucial because it enables precise control over material properties, leading to improved performance, efficiency, and cost-effectiveness in production processes. However, this understanding poses many challenges, such as the
subnanoscale electron microscopy figure

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing
The properties of advance materials are becoming ever more reliant on the ability to manipulate their chemistry and structure at very fine length scales. For example, the relevant feature sizes in state-of-the-art transistors continue to decrease, even as the complexity of the architectures employed

Surface Desorption Ambient Mass Spectrometry

Ongoing
The Surface and Trace Chemical Analysis Group maintains a range of research avenues into the characterization, analysis, and optimization of various commercial and in-house developed surface desorption ion sources. These research avenues also aim to advance our fundamental understanding of the

Synchrotron Resonant Scattering and Diffraction

Ongoing
The Resonant Scattering and Diffraction effort seeks to develop measurements that provide spatial correlations in chemical, electronic, and physical structure in advanced materials. Scattering technology is developed as part of the NIST BNL partnership at the National Synchrotron Light Source II in

Synchrotron X-ray Absorbance Spectroscopy

Ongoing
The Absorbance Spectroscopy effort seeks to develop measurements that provide details of the local chemical, electronic, and physical structure in advanced materials. Spectrometer technology is developed as part of the NIST BNL partnership at the National Synchrotron Light Source II in Upton, NY

Synchrotron X-ray Spectroscopic Imaging

Ongoing
Building off technologies and expertise developed in the Synchrotron X-ray Absorption Spectroscopy project, the Spectroscopic Imaging effort seeks to develop measurements that provide spatial mapping of the local chemical, electronic, and physical structure in advanced materials. Technology is
Project Infographic for synthesis and longevity of candidate direct air capture (DAC) materials

Synthesis and longevity of candidate direct air capture (DAC) materials

Ongoing
We have been working on the identification and development of repeatable synthesis techniques for DAC materials for the purposes of generating repeatable samples for evaluating DAC characterization techniques. We have initially focused on impregnated and grafted aminosilane-silica materials. We are

Thermal Desorption Ambient Mass Spectrometry

Ongoing
The Surface and Trace Chemical Analysis Group is involved in a number of research avenues for the rapid screening of wipe-collected samples for the security and forensic chemistry fields. Similar to the widely-deploy ion mobility spectrometry (IMS) systems for screening, this is accomplished through

Time-of-Flight Secondary Ion Mass Spectrometry

Ongoing
ToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples. A pulsed, energetic “primary” ion beam bombards the surface and induces a collision cascade, liberating “secondary” ions that are then

Tissue Engineering

Ongoing
Tissue Engineering Measurands: Tissue engineering measurands are confusing to discuss and a charting method to improve communication is demonstrated. Measurement Assurance Strategies for Regenerative Medicine: Reliable methods for assessing product consistency and quality. Regenerative Medicine