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Electromagnetic (EM) systems use magnetic components such as inductors, isolators, and adaptive filters, but these are currently bulky and difficult to
Advanced bonding and integration physically bring together components, devices, and materials that are produced separately. There are strong economic and
The goal of the metRology for Microsoft Excel* software project is to provide a convenient user interface using Microsoft Excel for some of the specialized
Resistance standards traceable to NIST provide references for measurements of current at levels from 3000 A to below 20 fA and are used to support a wide
This program aims to develop the metrology to enable quantitative understanding of, and the development of standards, in quality and reliability controls in
Part quality in additive manufacturing (AM) is highly variable due to inadequate dimensional tolerances, surface roughness, and defects, thereby limiting its
The goal of the metRology software project is to provide a set of specialized functions for statistical metrology as a package for the R software environment
As part of a multi-year interagency agreement between the Office of Standards of the Department of Homeland Security and NIST, NIST is developing measurement
The Micronutrients Measurement Quality Assurance Program (MMQAP) was initiated in 1984 by the National Cancer Institute Division of Cancer Prevention and
This project is developing means of quantitatively measuring chemical distributions in three dimensions at the nanometer scale in materials with complex
Our goal is to develop and demonstrate a MEMS-based methodology for evaluating time-dependent mechanical properties of materials that undergo exposure to
Heat management in semiconductor devices is a crucial problem currently limiting device performance and essentially all progress involving reduction of device
A comprehensive understanding of how current and next-generation materials impact the performance of semiconductor devices is critical to U.S. Semiconductor
Nanocalorimetry provides a capability to measure the thermal properties of very small samples and at very fast rates. Materials and interfaces of interest
Our objective is to develop atomic force microscopy-based methods to measure the structure of crack tips, the rates of crack growth, and the roughness of
A current lack of 3D characterization tools that meet semiconductor industry needs is hampering manufacturing fidelity and supply chain security. Developing new
Our goal is to develop measurement techniques to characterize the changes in thermal transport and thermal transition temperatures in polymeric and hybrid
The Nanotechnology Xccelerator is a pilot program to develop a powerful new family of foundry platforms and test vehicles for academics to do scientific
Nanotube metrology improvement is a significant effort in the Particles, Tubes and Colloids project dedicated to improving the measurement methods for, and
OWM's National Legal Metrology Program (NLMP) is hosting a new series of Weights and Measures Information Hours. Each "Info Hour" session (one-hour duration)
It’s an old phrase, but the world keeps getting smaller every day! This is especially true when it comes to the global marketplace and our reliance on one
We use a variety of measurement tools to gain a full understanding of current drug and explosive threats. Particle size, chemical composition, morphology