Tools and Instruments

Displaying 1 - 9 of 9

Atom Probe Tomography (LEAP 4000X Si/HR – Local Electrode Atom Probe)

LEAP 4000X Si/HR Imaging time-of-flight mass spectrometer and field ion microscope. Can deliver 3-D, isotopically- and chemically- resolved images Sub-nanometer

Focused Ion Beam

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements

Fourier Transform Infrared Spectroscopy

Fourier Transform Infrared (FTIR) Spectroscopy is a spectroscopic technique in which the vibrational modes of the molecules comprising a material of interest

Microcalorimeter Detector

The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to

NIST PTIR Instrumentation and Capabilities

Photothermal induced resonance (PTIR) combines the spatial resolution of atomic force microscopy (AFM) with the specificity of absorption spectroscopy

Ozone Standard Reference Photometer

DESCRIPTION The Standard Reference Photometer (SRP) Program began in the early 1980s as collaboration between NIST and the U.S. Environmental Protection Agency

Prompt Gamma-Ray Activation Analysis (PGAA)

Prompt gamma-ray activation analysis is a measurement technique for nondestructive elemental analysis. Samples are irradiated by a beam of neutrons inducing

TESCAN MIRA3 for automated electron microscopy

A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of