Tools and Instruments

Displaying 1 - 20 of 20

Differential Scanning Calorimeter

Differential Scanning Calorimetry, or DSC, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is

Focused Ion Beam Scanning Electron Microscope (Helios 660)

The Helios 660 NanoLab (HNL660) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase

Fourier Transform Infrared Spectroscopy

Fourier Transform Infrared (FTIR) Spectroscopy is a spectroscopic technique in which the vibrational modes of the molecules comprising a material of interest

Instrument scientists Conan Weiland (left) and Nick Quackenbush (right) at the Hard X-ray Photoelectron Spectrometer (HAXPES).

Hard X-ray Photoelectron Spectroscopy (HAXPES)

The Hard X-ray Photoelectron Spectroscopy (HAXPES) end station uses a tunable, focused X-ray beam in the tender spectrum (2.0 keV to 7.5 keV) to probe the depth

hotograph of the custom high temperature (>300 K) scanning instrument that measures electrical resistivity and Seebeck coefficient

High Throughput (Combinatorial) Screening Tool for Characterization of Thin Film Thermoelectrics as a Function Temperature

Description High-throughput (combinatorial) metrologies have evolved as a useful approach to rapidly determine the composition-structure-property relationships

Hysitron PI-85 Picoindentor

This in-situ indentation system can be integrated into electron microscopes as well as being run in other unusual setups. With a load capacity of 150 mN, this

Photo of the Large Area Rapid Imaging Tool Mark I (LARIAT I) at the National Synchrotron Light Source.

Large Area Rapid Imaging Analytical Tool (LARIAT I)

In contrast to scanning transmission X-ray microscopy (STXM), the Large Area Rapid Imaging Tool provides full field imaging capabilities over a relatively large

View of the Large Area Rapid Imaging Tool Mark II (LARIAT II) before installation at the National Synchrotron Light Source II.

Large Area Rapid Imaging Analytical Tool (LARIAT II)

In contrast to scanning transmission X-ray microscopy (STXM), the Large Area Rapid Imaging Tool provides full field imaging capabilities over a relatively large

Nanocalorimeter Calibration System

The Nanocalorimeter Calibration System is used to calibrate each individual nanocalorimeter sensor chip used in the nanocalorimetry measurements project. The

Nanocalorimeter Measurement System

This Nanocalorimeter Measurement System is used for nanocalorimetry measurements at fast heating rates (100 °C/s to 100,000 °C/s) and measurements of samples

View of the Near Edge X-ray Fine Structure (NEXAFS) experimental station operated by the NIST Synchrotron Science Group at the National Synchrotron Light Source II.

Near Edge X-ray Absorption Fine Structure (NEXAFS)

The Near Edge X-ray Absorption Fine Structure (NEXAFS) experimental stations uses a tunable, focused monochromatic beam of soft X-rays (0.1 keV to 2.2 keV) to

NIST PTIR Instrumentation and Capabilities

Photothermal induced resonance (PTIR) combines the spatial resolution of atomic force microscopy (AFM) with the specificity of absorption spectroscopy

A picture of the NIST resonant soft xray instrument and visiting NIST scientists

Polarized Resonant Soft X-ray Scattering (P-RSoXS)

Built with a collaboration with the RSoXS project in the NIST Materials Science and Engineering Division, polarized resonant soft X-ray scattering (P-RSoXS) is

Positron Annihilation Lifetime Spectrometer

Positron annihilation lifetime spectroscopy uses positrons to probe material defects/voids/free volume at the sub-nm scale. The general working principle is

Soft X-ray Absorption and Emission Spectroscopy (µCAL)

The Soft X-ray Absorption and Emission Spectrometer uses an array of Transition Edge Sensors, superconducting thin films that are biased into their

SPHERE

In the artificial ultraviolet (UV) weathering of materials, a need exists for weathering devices that can uniformly illuminate test specimens with a high level

$View of the sample area in the X-ray Diffraction (XRD) end station on the Beamline for Material Measurement (BMM).$

Synchrotron X-ray Diffraction (XRD)

The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials. At

Thermogravimetric Analyzer

Thermogravimetric Analysis, or TGA, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is used for

Vector Potential Photoelectron Microscope (VPPEM)

The Vector Potential Photoemission Microscope endstation sits at the end of both the SST-I and SST-II beamlines, providing both soft (0.1 keV to 2.2 keV) and

Picture of the sample area of the NIST X-ray Adsorbtion Fine Structure instrument, with NIST scientist Bruce Ravel, located at the National Synchrotron Light Source.

X-ray Absorption Fine Structure (XAFS)

The XAFS station uses a tunable, monochromatic, and moderately high energy X-ray beam (4.5 keV to 23.5 keV) for X-ray absorption spectroscopy measurements. The