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Nanotechnology

Nanomaterials

News and Updates

Projects and Programs

MNP Metrology Program

Microplastic and Nanoplastic Metrology

Ongoing
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our
Schematic illustration of the integrated near-field optoelectronic (INFO) probe showing light emission, microwave reflection lines for measuring specimen conductivity and/or magnetization, and simultaneous contact topography feedback.  

Integrated Near-field Optoelectronic (INFO) Scanning Probe

Ongoing
In a collaboration between the Nanoelectromagnetics Project and the Quantitative Imaging Project, we have fabricated and tested a GaN nanowire mounted on an AFM tip as a near-field scanning microwave microscopy (NSMM ) tip (see Fig. 2(a) below ). A tungsten atomic layer deposition (ALD) coating

Analysis of Copper Incorporation Into Zinc Oxide Nanowires

The lasing capabilities and piezoelectric properties of single ZnO nanowires offer promise for future technologies. However, the photoluminescence of ZnO nanowires differs depending upon the synthesis method and the defects present in the sample. This project was undertaken to characterize zinc

Publications

Solution Synthesis of NdTe3 Magnetic Nanosheets

Author(s)
Joel Swanson, Salah El Jamal, Tyler Hartman, Orlando Stewart, Priscilla Glaser, Adam Biacchi, DaVonne Henry, Amy Liu, Sarah Stoll
Neodymium tritelluride is a layered van der Waals material, with correlated electronic properties including high electronic mobility, charge density waves, and

Software

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Raman facility

Raman scattering is a powerful light scattering technique used to diagnose the internal structure of molecules and crystals. In a light scattering experiment

Awards

Vincent Hackley Honored by ASTM

In recognition of consistent dedication and outstanding service to ASTM Committee E56 on Nanotechnology since the committee’s inception in