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CHIPS R&D Chiplets Interfaces Technical Standards Workshop

CHIPS R&D Chiplets Interfaces Technical Standards workshop
Credit: Andrew Kim

The CHIPS Research and Development Office’s Chiplets Interfaces Technical Standards Workshop will be held as a hybrid in-person and virtual event from 8:30 a.m. to 5:30 p.m. Eastern Time December 12, 2023, and 8:30 am to 12:30 pm December 13, 2023.  This event will bring together technical experts from industry, academia, standards setting organizations, and industry alliances, domestic and abroad, to identify community priorities for specific standards efforts.

The workshop will be a place to foster collaboration, coordination, and innovation within the semiconductor industry's standards community. Participants will discuss the potential for chiplet-based architectures to drive progress in the semiconductor and microelectronics industry and the role of technical standards for physical and logical interfaces in enabling innovation. Factors to be considered in identifying standards priorities include potential for broad impact, feasibility for accelerated development, and suitability for various standards development channels, including through alliances, incubators and accelerators, and standards setting organizations.

This one and one-half day hybrid event provides an opportunity to network and exchange ideas with thought leaders across the sector. The morning of Day One features plenary and panel sessions with exemplary keynote and guest speakers. Breakout sessions the afternoon of Day One and the morning of Day Two provide an opportunity for participants to collaborate and discuss key topics that will shape future chiplets standards activities. Key findings will be published in a post-workshop report and will inform standards planning efforts across the semiconductor innovation ecosystem and within the CHIPS R&D Office.

We encourage interested stakeholders, industry representatives, and standards setting organizations to participate actively in this pivotal event. We also invite international attendees, as fostering global collaboration and enriching the discussions on advancing semiconductor standards and innovation is paramount to success. Join us at the CHIPS R&D Chiplets Interfaces Technical Standards Workshop as we collaboratively shape the future of semiconductor and microelectronics standards, foster innovation, and advance the industry as a whole. Finally, we note that a related workshop focused on digital twin technical standards will be held Dec. 14-15 at the same site. Information regarding this related workshop (separate registration required) can be found on the chips.gov website for those who may want to attend both events.

You can find the Workshop Summary Report here

The CHIPS Research and Development (R&D) Office held a series of events to obtain public input from stakeholders on standards priorities for the semiconductor sector. At the inaugural CHIPS R&D Standards Summit in Washington, DC in September 2023, private sector thought leaders provided broad input on strategic priorities as detailed in the Summary Report. Some of the recommendations included exploring standards opportunities within specific technical priority areas and metrics to strengthen the link between research and standards. A series of follow-on technical workshops were held in December 2023, April 2024, and June 2024 to explore these recommendations from the Summit. Each workshop was organized by a diverse planning committee and featured a mix of presentations from experts in the field followed by interactive breakout discussion sessions. These events assembled technical experts from the semiconductor industry, academia, standards setting/development organizations (SSOs /SDOs), industry alliances, and government to discuss opportunities in the semiconductor community for the following areas:

  1. Chiplets Interfaces Technical Standards                                                  December 12-13, 2023
  2. Digital Twin Technical Standards                                                               December 14-15, 2023
  3. Semiconductor Supply Chain Trust and Assurance Data Standards              April 2-3, 2024
  4. Digital Twin Data Interoperability Standards                                                        April 4-5, 2024
  5. Standardization Readiness Level                                                                                June 4-5, 2024

In the first two workshops in December 2023, participants discussed the potential for chiplet-based architectures and digital twin applications, respectively, to drive progress in the semiconductor industry and the role of standards for enabling innovation. Two follow-on workshops were held in April 2024 to identify the data standards needed to assure secure electronics supply chains and to further refine the priorities for digital twin data interoperability standards, respectively. In the fifth workshop, participants discussed whether well-defined standardization readiness level metrics, tailored for use in semiconductor standards development, could serve as a crucial guide for determining if and when research outcomes should be integrated into voluntary industry standards activities. More complete event descriptions can be found on the web pages for each workshop (links provided above).

The first four workshops focused on identifying community standards opportunities in technical priority areas identified by industry during the Summit. During each workshop, participants debated, consolidated, and used interactive polling to upvote the top standards ideas for the technical focus area being discussed. The top standards needs identified by participants during each workshop are listed below.

1.Chiplets Interfaces Standards Needs:

  • System optimization (modeling, simulation, and testing standards)
  • Security and traceability testing standards
  • General testing and verification standards (outside of security)
  • Interconnection protocol 
  • Chiplet abstraction (e.g., process design kits (PDKs))

2. Digital Twin for Semiconductor Manufacturing Standards Needs:

  • Interoperability (data models, digital twin interfaces, digital twins communicating with other digital twins)
  • Digital twin taxonomy and definitions
  • Security (data provenance, traceability, digital thread)
  • Testing, validation, verification (reliability testing, uncertainty verification, benchmark testing, methodologies, creation of new metrics)
  • Existing standards (database of standards, analysis of standards, governance)

3. Semiconductor Supply Chain Trust and Assurance Data Standards Needs:

  • Semantic definitions, assets, and standards to support traceability and provenance of semiconductor materials and data, both in the physical and virtual space, across the entire product lifecycle.
  • Develop an updated, more accessible, parameterized database of existing supply chain trust and assurance data standards (e.g., taxonomy, matrix, graph, analytic tool, etc.).
  • More precise, scalable, and diverse methods and identifiers for traceability (this enables more credible provenance).
  • Develop an umbrella/macro-level framework for aligning standardization activities across the semiconductor supply chain.
  • Standardized format/architecture/security/automated key management/proof of authority/ identify verification and management for sustainment chains, distributed ledgers

4. Digital Twin Data Interoperability Standards Needs:

  • Develop a shared hierarchical relationship of digital twin systems (mesh/context and layers of detail/granularity/resolution). Develop a roadmap for standards [may use the International Roadmap for Devices and Systems (IRDS), smart manufacturing section, as a starting point].
  • New and/or standard methods for communicating accuracy difference/uncertainty between the real event (i.e., actual metrology) and the predictions from the digital twin (i.e., virtual metrology). 
  • Clear definition of context-specific interfaces. 
  • Global, automated, cryptographic identifiers and key management infrastructure (to ensure seamless, zero trust cybersecurity for digital twins across domains).
  • Standard for tracing/attributing changes to data as it travels through the supply chain.

5. Standardization Readiness Level Framework and Scale Recommendations:

  • A consensus framework would help inform standards strategies for emerging semiconductor technologies and should be further developed.
  • An existing, notional NIST standardization readiness framework—with elements of technology, market, and community—provides a good baseline of considerations that are also applicable to semiconductor standards development.
  • The NIST framework should be expanded to include best-practices for community-building, including highlighting the role of incubators and accelerators in providing opportunities to collaborate on pre-standardization activities. 
  • A simple-to-use standardization readiness level scale would be useful for understanding and communicating the standards process and lifecycle.

Workshop participants across all five workshops also made broad recommendations for the semiconductor standards community. A summary of some of the key recommendations from the participants are provided below:

  • An alliance of standards setting and development organizations would help to guide the development of standards for the semiconductor industry. Some of the proposed activities of the alliance could include:
    • Developing and maintaining a semiconductor standards roadmap
    • Convening industry to identify priorities, inform roadmaps, form working groups, etc. 
    • Developing and maintaining standards registries
  • A critical assessment of existing standards across all major topic areas of the first four workshops (i.e., chiplets, digital twins, digital twin data interoperability, supply chain trust and assurance data) is needed to avoid duplication or siloed standards efforts. This would be assisted by having standards registries.
  • Standards education must be emphasized at all levels in the semiconductor supply chain and should serve broad audiences (e.g., technical experts, fab operators, workforce developers, finance specialists, executives, etc.)
  • The CHIPS R&D programs and institutes should consider how to support semiconductor standards development activities.

More information about each of these standards needs, recommendations, and other key findings from each workshop will be detailed in forthcoming reports that will be posted on each workshop event page. 

Adam CronSynopsys
Tom Katsioulas Archon Design Solutions, Inc. 
Paul TrioSEMI Standards
Bapi VinnakotaLawrence Berkeley National Laboratory
Parshuram ZantyeLam Research
Simon FrechetteNIST Engineering Laboratory
Michael PeaseNIST Information Technology Laboratory
Guodong ShaoNIST Engineering Laboratory
Yaw ObengCHIPS R&D Program
Jan Obrzut CHIPS R&D Program
Mary Bedner CHIPS R&D Program

 

DAY 1: December 12, 2023/ 8:30 AM - 5:35 PM
TIMETOPICPRESENTER
7:30 –8:30 amCheck-in 
8:30 –8:35 amIntroduction to the workshop / review agenda / logisticsJan Obrzut (CHIPS R&D)
8:35 –8:50 amKeynote 1: Chiplets – The Centerpiece of Advanced PackagingSubramanian Iyer (Director, National Advanced Packaging Manufacturing Program, CHIPS R&D) (Virtual)
8:50 – 9:05 amKeynote 2: Importance of Technical Standards in the Semiconductor EcosystemKathleen Kingscott (IBM Research)
9:05 – 10:30 am

Panel 1: Tutorial on chiplets interface standards

 

Lalitha Immaneni (Intel) Moderator
 
  1. Die-to-die parallel interfaces for the emerging chiplet market
  2. Building the open chiplet economy

 

  1. A standard for chiplet interconnect test and repair
  2. The realities of physical limits and prospects for 2 / 2.5 -D and 3-D interconnects
  1. Elad Alon (Blue Cheeta Analog)  (Virtual)
  2. Bapi Vinnakota (Open Compute Project)
  3. Sreejit Chakravarty (Ampere)
  4. Dev Gupta (APSTL) (Virtual)

 

10:30 –10:45 amBreak    
10:45 –11:45 am

Breakout Session 1: Discuss and prioritize ideas related to panel 1

 

Led by SIDEM and Corner Alliance facilitators
11:45 –12:00 pmReport Out from Breakout Session 1Workshop participants and facilitators
12:00 –1:15 pm

Lunch   

 

 
1:15 –2:15pmPanel 2: State-of-the-art in chiplets interfaces         Gretchen Greene (NIST) Moderator
 
  1. Die-to-die parallel interfaces for the emerging chiplet market
  2. Packaging and chiplets: Needs for standards and EDA evolution
  3. Advanced packaging, assembly, test, and failure analysis
  4. Experience and ideas for enhancing the chiplet ecosystem, die-to-die interfaces, packaging supply chain limitations, business model challenges, and optical packaging requirements
  5. Chiplets interfaces challenges in packaging
  1. Andreas Olofsson (Zero ASIC)
  2. Lalitha Immaneni (Intel)
  3. Yan Li (Samsung)
  4. Chen Sun (Ayar Labs) (Virtual)
  5. Jeff Rearick (AMD) (Virtual)
2:15 –3:15pmBreakout Session 2: Discuss and prioritize ideas related to panel 2Led by SIDEM and Corner Alliance facilitators
3:15 –3:30pmReport Out from Breakout Session 2Workshop participants and facilitators
3:30 –4:00pmBreak 
4:00 –4:45 pmPanel 3: Current state of research in chipletsVeruska Malave (NIST) Moderator
 
  1. Photonics packaging

 

  1. Modeling challenges of systems co-design

 

  1. High-level approaches to hardware and embedded security
  2. The tradeoffs between performance and resources in natural and engineered systems
  1. Peter O’Brien (Tyndall Institute) (Virtual)
  2. Ganesh Subbarayan (Purdue University)
  3. Ramesh Karri (NYU)
  4. Pamela Abshire (U. Md)

 

4:45 –5:15 pmBreakout Session 3: Prioritize ideas from panels 1, panel 2, and panel 3Led by SIDEM and Corner Alliance facilitators
5:15 – 5:35pmReport Out from Breakout Session 3Workshop participants and facilitators
5:35pmAdjourn 

 

DAY 2: December 13, 2023/ 8:30 AM – 12:00 PM
8:30 –9:30 am

PANEL 4: Summary Discussion/Takeaways from

Day 1

Andreas Olofsson (Zero Asic) Moderator
 

Questions:

  • What are the technical standards gaps?
  • What information is needed to address the gaps?
  • How do we prioritize which standards to work on?
  • Who can help with the standards development effort?
  • Which SSO's should be working on these issues?

Panelists:

  1. Bapi Vinnakota (Open Compute Project)
  2. Lalitha Immaneni (Intel)
  3. Chen Sun (Aylar Labs) (Virtual)
  4. Melissa Grupen-Shemansky (SEMI)
  5. Debendra Das Sharma (UCIe Consortium Standards) (Virtual)
9:30 – 10:30 amBreakout Session 4: Discuss and prioritize ideas related to panel 4Led by SIDEM and Corner Alliance facilitators
10:30 –11:00 amBreak 
11:00 –12:00pmReport Out from Breakout Session 4 and consolidation of prioritiesWorkshop participants and facilitators
12:00 –12:30 pmDiscuss next stepsJan Obrzut & Yaw Obeng (CHIPS R&D Office)
12:30 pmEnd of workshop - adjourn 

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For Non-US Citizens:  Please have your valid passport for photo identification.

For US Permanent Residents: Please have your green card for photo identification.

For US Citizens: Please have your state-issued driver's license. Regarding Real-ID requirements, all states are in compliance or have an extension through May 2025.

NIST/NCCoE also accepts other forms of federally issued identification in lieu of a state-issued driver's license, such as a valid passport, passport card, DOD's Common Access Card (CAC), Veterans ID, Federal Agency HSPD-12 IDs, and Military Dependents ID.

Created October 17, 2023, Updated November 25, 2024