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Office of the Director

News and Updates

Displaying 3201 - 3225 of 6000
NIST Campus, Gaithersburg, MD

iNEMI Board of Directors Visits NIST

NIST hosted the Board of Directors of the International Electronics Manufacturing Initiative (iNEMI) on Wednesday, Dec. 10, 2014, for a half-day overview on
Student uses a tabletop SEM

PML Outreach Promotes STEM Excitement

Michael Postek of PML's Semiconductor & Dimensional Metrology Division has been an instrumental part of an outreach to bring access to tabletop scanning
Transmission electron microscopy image of a thin cross section of 160 nanometer trenches shows deposited nickel completely filling the features without voids.

NIST-Intel Partnership Workshop

In November, 2014, NIST hosted the seventh in a series of workshops in a NIST-Intel partnership effort on Emerging Nanoscale Interface and Architecture
Silicate bond sample

Thin, Strong Bond for Vacuum Seal

An ultra-stable, ultra-thin bonding technology has been adapted by researchers in PML's Semiconductor and Dimensional Metrology Division for use as a super
photo of NISTAR instrument

Taking the Wraps off NISTAR

The NIST Advanced Radiometer (NISTAR), mothballed for more than a decade, is slated to make its space debut very soon about 1.5 million kilometers sunward of
atomic placement options

Computing with Single Atoms

As features on silicon microchips continue to shrink, the final frontier of miniaturization is a transistor on the scale of a single atom – a technology that